IST2008-43 | LMSƒAƒ‹ƒSƒŠƒYƒ€‚ð—p‚¢‚½ƒtƒHƒAƒOƒ‰ƒ“ƒhƒLƒƒƒŠƒuƒŒ[ƒVƒ‡ƒ“A/D•ÏŠ·Ší ‚‹´—F”üE‘哇@rEŽR˜e‘å‘¢i“ú—§j |
IST2008-44 | A 15b Pipeline ADC Using Non-Slewing Amplifers and Digital Calibration of Incomplete Settling Errors Shoji KawahitoEKazutaka HondaEZheng LiuEKeita YasutomiEShinya ItohiShizuoka Univ.j |
IST2008-45 | 2dÏ•ªŠí‚ð—p‚¢‚½˜A‘±ŽžŠÔŒ^ƒI[ƒo[ƒTƒ“ƒvƒ‹ƒ¢ƒ°•Ï’²Ší‚ÌÏ•ªƒtƒBƒ‹ƒ^‡¬Žè–@‚ÌŒŸ“¢ “¹³Žu˜YE¼ì˜a•vEŽO’J—z‰îE‚ŽR‰ë•vE¬”¦KŽkiƒpƒiƒ\ƒjƒbƒNj |
IST2008-46 | Cyclic•ûŽ®D/AƒRƒ“ƒo[ƒ^‚Ì“Á’¥‚ð¶‚©‚µ‚½ƒŠƒjƒAƒŠƒeƒB“Á«‰ü‘PŽè–@ âV“¡@qE¬—щp®E¼–{“N–çEŽl–ö“¹•viNECƒGƒŒƒNƒgƒƒjƒNƒXj |
IST2008-47 | ƒOƒ‰ƒ“ƒhƒ‰ƒCƒ“‚ł̓dˆ³~‰º‚̉e‹¿‚ðŽó‚¯‚È‚¢“d—¬Œ¹‚Æ,“ü—̓fƒBƒWƒ^ƒ‹•„†‚Ɉˑ¶‚·‚鎞’蔕ω»‚̂Ȃ¢o—Í’[Žq\¬‚Æ‚ð—p‚¢‚½MOS,14ƒrƒbƒg,‚‘¬DAC‚ÌŒŸ“¢ ¬ˆé‘ì–çE™–{‘×”Ži’†‘åj |
IST2008-48 | CMOS‘•‰ñ˜H‚ÌÅ“K‰»ÝŒv‚ÌŒŸ“¢‚ÆAB‹‰‘•‰ñ˜H\¬‚Ì—L—p« ‰F–ì³KEìlË“ñiɪ‘åj |
IST2008-49 | ƒfƒWƒ^ƒ‹¸“x•ⳉñ˜H‚ð“‹Ú‚µ‚½‚‘¬E’á“d—ÍCMOS—ÊŽq‰»Ší Œ´“c—ÇŽ}E¡ˆä‹`”ŽE‹g“c@‹BEŠâ“c@–siL“‡‘åj |
IST2008-50 | MATLAB/Simulink‚ð—p‚¢‚½DC-DCƒRƒ“ƒo[ƒ^‚̃Vƒ~ƒ…ƒŒ[ƒVƒ‡ƒ“Žè–@‚ÉŠÖ‚·‚錟“¢ ì’[çqE™–{‘×”Ži’†‘åj |
IST2008-51 | ’á“dˆ³CMOSƒfƒBƒWƒ^ƒ‹‰ñ˜H‚Ì“Á«ƒoƒ‰ƒcƒL•âž‹Zp‚Ì\’z ŽŸ“c—S•ãEã–쌛ˆêi–k‘åjCœA£“N–çi_ŒË‘åjCóˆä“N–çE‰J‹{Dmi–k‘åj |
IST2008-52 | MOSFET‚̃TƒuƒXƒŒƒbƒVƒ‡ƒ‹ƒh“Á«‚ð—˜—p‚µ‚½’´’áÁ”ï“d—ÍCMOSŽQÆ“dˆ³Œ¹‰ñ˜H ã–쌛ˆêi–k‘åjCœA£“N–çi_ŒË‘åjCóˆä“N–çE‰J‹{Dmi–k‘åj |
IST2008-53 | 1‰æ‘fƒ}ƒbƒ`ƒ“ƒO‚É‚æ‚é‚‘¬2ŽŸŒ³“®‚«ŒŸoƒCƒ[ƒWƒZƒ“ƒT‚ÌŽŽì‚Æ•]‰¿ •Ý–ì“Ö‹IE’†ŽRŒ«ˆêE™“cr’´E•l–{—²”Vi“Œ‹ž—‰È‘åjCŽ™‹Ê˜a–çiNIIj |
IST2008-54 | ‘½d“dˆ³E“d—¬“Ç‚Ýo‚µ“®ì‚ð—p‚¢‚½üŒ`‰ž“š’´Lƒ_ƒCƒiƒ~ƒbƒNƒŒƒ“ƒWCMOSƒCƒ[ƒWƒZƒ“ƒT ˆäo“TŽqEÔ‰H“ÞXE{쬗˜i“Œ–k‘åj |
IST2008-55 | ’á“dˆ³E’áÁ”ï“d—͋쓮ƒ\[ƒX•Ï’²Œ^ƒpƒ‹ƒX••Ï’²•ûŽ®ƒCƒ[ƒWƒZƒ“ƒT‚ÌŒ¤‹† ޳ŒËŽOŽl˜YEùì´—²i“Þ—Çæ’[‘åjCìŒiˆê˜Yiã‘åjC“¿“c@’E‘¾“c@~i“Þ—Çæ’[‘åj |
IST2008-56 | [ˆË—Šu‰‰]ŒŽŽü‰ñ‰q¯‚©‚®‚â“‹ÚƒnƒCƒrƒWƒ‡ƒ“ƒJƒƒ‰ƒVƒXƒeƒ€ ‘¾“–쇈êiNHK-ESjCŽR臈êEŽO‹´ŽŸEŽR“à³miNHKjC–{“c—Œbi‚’m‘åj |
IST2008-57 | mµ‘Òu‰‰n‚΂ç‚‚«l—¶ÝŒv‚ÉŒü‚¯‚Ä ¬–쎛Gri‹ž‘å/JSTj |
IST2008-58 | mµ‘Òu‰‰nMOSFET‚̃XƒP[ƒŠƒ“ƒO‚ƃAƒiƒƒO/RF“Á« -”÷×MOS‚̓AƒiƒƒO/RF‚ɂƂÁ‚Ä–¡•û‚Ȃ̂©- ‘å•’B–çi“ŒŽÅƒZƒ~ƒRƒ“ƒ_ƒNƒ^[j |
IST2008-59 | mµ‘Òu‰‰n”÷×MOSƒfƒoƒCƒX‚̃‰ƒ“ƒ_ƒ€EƒeƒŒƒOƒ‰ƒtEƒVƒOƒiƒ‹EƒmƒCƒY {쬗˜i“Œ–k‘åj |
IST2008-60 | mµ‘Òu‰‰n”÷׃fƒoƒCƒX‚ð—p‚¢‚½’á“dˆ³E‚¸“xADC‰ñ˜H‹Zp‚Ì‰Û‘è‚Æ‹Zp“®Œü Œã“¡–M•Fi•xŽm’ÊŒ¤j |
IST2008-61 | mµ‘Òu‰‰nDirection for High Performance Analog Circuit Integration Toshihiko HamasakiiTexas Instrumentsj |
- | mƒpƒlƒ‹“¢˜_nƒTƒu100nm CMOSƒfƒoƒCƒX‚É‚æ‚éƒAƒiƒƒO‰ñ˜HÝŒv‚Ì‰Û‘è‚Æ“W–]i—\e‚È‚µj ìlË“ñiɪ‘åjC{쬗˜i“Œ–k‘åjC‘å•’B–çi“ŒŽÅjC¬–쎛Gri‹ž‘åjCŒã“¡–M•Fi•xŽm’ÊŒ¤jCà_è—˜•Fi“ú–{TIjC“¹³Žu˜Yi¼‰º“dŠíj |
IST2008-62 | ‘fŽq‚΂ç‚‚«‚ðl—¶‚µ‚½‰·“xƒZƒ“ƒT‰ñ˜H‚ÌÅ“K‰»ÝŒv “c“‡‰pKE¬ŽR“NOEŽRŒû@ŠîE‘“cª–¾EŽl–ö“¹•viNECƒGƒŒƒNƒgƒƒjƒNƒXj |
IST2008-63 | SOI-MOSFET‚ð—p‚¢‚½”\“®Œ^‚Ђ¸‚݃Zƒ“ƒT‚ÌŽŽì•]‰¿ Œ´“c’meE_’J—I‰îE‰œŽRŸ—YE¼‰º_ˆêiŽRŒ`‘åj |
IST2008-64 | ƒIƒ“ƒ`ƒbƒvEƒ}ƒ‹ƒ`ƒ`ƒƒƒlƒ‹ƒ‚ƒjƒ^‚É‚¨‚¯‚é”gŒ`Žæ“¾ƒAƒ‹ƒSƒŠƒYƒ€‚ÌŽÀ‘•‚Æ•]‰¿ r‰ê—CŽ÷E‹´“c‘ñŽuE‰i“c@^i_ŒË‘åj |
IST2008-65 | –Ô–Œ‰º–„‚ßž‚ÝŒ^lHŽ‹Šoƒvƒ‰ƒbƒgƒtƒH[ƒ€‚ÉŠÖ‚·‚錤‹† –ö¶Œ[—CEùì´—²i“Þ—Çæ’[‘åjCìŒiˆê˜Yiã‘åjC“¿“c@’E‘¾“c@~i“Þ—Çæ’[‘åj |
IST2008-66 | ƒRƒOƒjƒeƒBƒu–³üŒü‚¯‰Â•ϑшæƒfƒBƒWƒ^ƒ‹ƒoƒ“ƒhƒpƒXƒtƒBƒ‹ƒ^‚ÌÝŒv ’ß“c@“E˜aòT‘¾˜YE—›@ŠqßE’|“à@—²EìŒû@”ŽE‹g–{‰ë•Fi_ŒË‘åj |
IST2008-67 | ƒfƒWƒ^ƒ‹‰ñ˜H‚Å\¬‚µ‚½300MHz‘Ñ–³ü‘—M‹@LSI‚Æ’á“d—̓Zƒ“ƒT[’[––‚Ö‚Ì“K—p —é–ØŒ«ŽiE‰F‰ê_ŽçEŒ´“c@[iNTTj |
IST2008-68 | A 100Mbps, 0.41mV Impulse UWB Transceiver Based on Leading Edge Detection Technique Lechang LiuEYoshio MiyamotoEZhiwei ZhouEKosuke SakaidaEJisun RyuEKoichi IshidaEMakoto TakamiyaETakayasu SakuraiiUniv. of Tokyoj |
IST2008-69 | ƒXƒyƒNƒgƒ‹•ÏŠ·‚ð—p‚¢‚½ƒWƒbƒ^’ጸ‰»‰ñ˜H‚ð—L‚·‚é10Gbit/sƒf[ƒ^ƒ^ƒCƒ~ƒ“ƒO¶¬IC 쑺’q–¾E‘å—F—S•ãiNTTj |
IST2008-70 | ˆã—×pƒfƒoƒCƒX‚ÉŒü‚¯‚½’áÁ”ï“d—Í”UŠí‚ÌŒŸ“¢ ¼‰iŒ«ˆêE‘q‰È@—²E¼àV@ºi“ŒH‘åj |
IST2008-71 | ‚¸“xŽüŠú”äŠrŠí‚ð—p‚¢‚½ƒ‹[ƒv“Á«‚Ɉˑ¶‚µ‚È‚¢ƒfƒWƒ^ƒ‹§ŒäPLL‚ÌŒŸ“¢‚ÆŽŽì –qŒ´KLE’r•Ó«”VE–{‹v‡ˆêE²–ì‰hˆêi–k‘åj |