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| Chair |
|
Jun Ohta (NAIST) |
| Vice Chair |
|
Isamu Takayanagi (Aptina), Shigetoshi Sugawa (Tohoku Univ.) |
| Secretary |
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Masayuki Ikebe (Hokkaido Univ.) |
|
|
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| Chair |
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Kunio Uchiyama (Hitachi) |
| Vice Chair |
|
Masahiko Yoshimoto (Kobe Univ.), Toshihiko Hamasaki (TI) |
| Secretary |
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Yoshio Hirose (Fujitsu Labs.), Hiroaki Suzuki (Renesas) |
| Assistant |
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Toshimasa Matsuoka (Osaka Univ.), Ken Takeuchi (Univ. of Tokyo), Kenichi Okada (Tokyo Inst. of Tech.) |
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| Conference Date |
Thu, Jul 22, 2010 09:30 - 18:20
Fri, Jul 23, 2010 09:15 - 17:50 |
| Topics |
Analog, Mixed analog and digital, RF, and sensor interface circuitry |
| Conference Place |
Josho Gakuen Osaka Center |
| Transportation Guide |
http://www.josho.ac.jp/osakacenter/index.html |
Contact
Person |
Prof. Hiroshi Makino
06-6346-6367 (Hall) |
| Sponsors |
This conference is co-sponsored by IEEE SSCS Japan/Kansai Chapter
|
Thu, Jul 22 AM
09:30 - 13:00 |
(1)
IEICE-ICD |
09:30-09:55 |
On-Chip Waveform Capture and Diagnosis of Power Delivery in SoC Integration |
Takushi Hashida, Hiroshi Matsumoto, Makoto Nagata (Kobe Univ.) |
(2)
IEICE-ICD |
09:55-10:20 |
The Minimal Structure of On-Chip Monitoring and Application to Evaluation of Chip Environments |
Yuuki Araga, Takushi Hashida, Makoto Nagata (Kobe Univ.) |
(3)
IEICE-ICD |
10:20-10:45 |
In-situ Evaluation of Vth and AC Gain of 90 nm CMOS Differential Pair Transistors |
Yoji Bando, Satoshi Takaya, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) |
(4)
IEICE-ICD |
10:45-11:10 |
Buffer-Ring-Based All-Digital On-Chip Monitor for PMOS and NMOS Process Variability |
Tetsuya Iizuka, Toru Nakura, Kunihiro Asada (Univ. of Tokyo) |
| |
11:10-11:20 |
Break ( 10 min. ) |
(5)
IEICE-ICD |
11:20-12:10 |
[Invited Talk]
Digital Calibration and Correction Methods for CMOS-ADCs |
Shiro Dosho (Pana) |
(6)
IEICE-ICD |
12:10-13:00 |
[Invited Talk]
A 10b 50MS/s 820uW SAR ADC with on-chip digital calibration |
Sanroku Tsukamoto (Fujitsu Labs.) |
| |
13:00-14:00 |
Lunch Break ( 60 min. ) |
Thu, Jul 22 PM
14:00 - 18:20 |
(7)
IEICE-ICD |
14:00-14:50 |
[Invited Talk]
Digitally-Assisted Analog Test Technology |
Haruo Kobayashi, Takahiro J. Yamaguchi (Gunma Univ.) |
(8)
IEICE-ICD |
14:50-15:40 |
[Invited Talk]
Trend in Multi-mode Multi-band transceivers |
Hisayasu Sato (Renesas) |
| |
15:40-15:50 |
Break ( 10 min. ) |
(9)
IEICE-ICD |
15:50-16:40 |
[Invited Talk]
A 2.1-to-2.8-GHz Low-Phase-Noise All-Digital Frequency Synthesizer with a Time-Windowed Time-to-Digital Converter |
Tadashi Maeda, Takashi Tokairin (Renesas), Masaki Kitsunezuka (NEC), Mitsuji Okada (Renesas), Muneo Fukaishi (NEC) |
| |
16:40-16:50 |
Break ( 10 min. ) |
| (10) |
16:50-18:20 |
Panel Discussion |
Fri, Jul 23 AM
09:15 - 12:20 |
(11)
IEICE-ICD |
09:15-09:40 |
Implementation of a CMOS Subthreshold Analog Amplifier using 0.5V Power Supply |
Tomochika Harada (Yamagata Univ.) |
(12)
IEICE-ICD |
09:40-10:05 |
OTA Design Using gm/ID Lookup Table Methodology
-- Featuring Settling Time Optimization -- |
Toru Kashimura, Takayuki Konishi, Shoichi Masui (Tohoku Univ.) |
(13)
IEICE-ICD |
10:05-10:30 |
Considerations of a common-mode feedback circuit in the CMOS inverter-based differential amplifier. |
Masayuki Uno (Linear Cell Design) |
(14)
IEICE-ICD |
10:30-10:55 |
The Design of a Gm Amplifier with the Improved Linearity by Using the Positive Feedback Compensation Scheme and its Application to High-frequency Filter Design |
Yusuke Shimoyama, Yasuhiro Sugimoto (Chuo Univ.) |
| |
10:55-11:05 |
Break ( 10 min. ) |
(15)
IEICE-ICD |
11:05-11:30 |
On-chip background calibration of time-interleaved ADC |
Takashi Oshima, Tomomi Takahashi (Hitachi) |
(16)
IST |
11:30-11:55 |
A/D converter for CMOS Image Sensor with a variable gain amplifier features |
Tetsuya Iida, Tomoyuki Akahori (BT), Mohd Amrallah Bin Mustafa, Keita Yastomi, Shoji Kawahito (Shizuoka Univ.) |
(17)
IST |
11:55-12:20 |
Interleaved ramp wave generator for single slope ADC |
Yukinobu Makihara, Shin Muon, Masayuki Ikebe, Junichi Motohisa, Eiichi Sano (Hokkaido Univ.) |
| |
12:20-13:20 |
Lunch Break ( 60 min. ) |
Fri, Jul 23 PM
13:20 - 17:50 |
(18)
IST |
13:20-14:10 |
[Invited Talk]
An All-Digital and Scalable Time-Mode A/D Converter TAD
-- Challenge for Sensor Circuit Digitalization -- |
Takamoto Watanabe (DENSO) |
(19)
IST |
14:10-15:00 |
[Invited Talk]
TDC and SOI Radiation Image Sensor for Particle Physics |
Yasuo Arai (KEK IPNS) |
| |
15:00-15:10 |
Break ( 10 min. ) |
(20)
IST |
15:10-15:35 |
Low noise sensor signal readout circuits with a response time acceleration technique |
Mars Kamel, Kawahito Shoji (Shizuoka Univ.) |
(21)
IST |
15:35-16:00 |
Design and Development of Polarization-Analyzing Image Sensor using 65nm CMOS Process |
Sanshiro Shishido, Toshihiko Noda, Kiyotaka Sasagawa, Takashi Tokuda, Jun Ohta (NAIST) |
(22)
IEICE-ICD |
16:00-16:25 |
User Customizable Logic Paper with 2V Organic CMOS and Ink-Jet Printed Interconnects |
Koichi Ishida, Naoki Masunaga, Ryo Takahashi, Tsuyoshi Sekitani (Univ. of Tokyo), higeki Shino (Mitsubishi Paper Mills Ltd.), Ute Zschieschang, Hagen Klauk (Max Planck Institute), Makoto Takamiya, Takao Someya, Takayasu Sakurai (Univ. of Tokyo) |
| |
16:25-16:35 |
Break ( 10 min. ) |
(23)
IEICE-ICD |
16:35-17:00 |
Self-Dithered Digital Delta Sigma Modulators for Fractional-N Frequency Synthesizers |
Zule Xu, Jun Gyu Lee, Shoichi Masui (Tohoku Univ.) |
(24)
IEICE-ICD |
17:00-17:25 |
A Study of High-speed Simulation Method for a Buck & Boost DC-DC Converters |
Masahiro Suzuki (Chuo Univ.), Syoko Sugimoto (AdIn), Yasuhiro Sugimoto (Chuo Univ.) |
(25)
IEICE-ICD |
17:25-17:50 |
Level Converter Circuit for Low Voltage Digital LSIs |
Yuji Osaki, Tetsuya Hirose, Nobutaka Kuroki, Masahiro Numa (Kobe Univ.) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Invited Talk | Each speech will have 40 minutes for presentation and 10 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| IST |
Technical Committee on Information Sensing (IST) [Latest Schedule]
|
| Contact Address |
Masayuki Ikebe (Hokkaido University)
TEL 011-706-7689,FAX 011-706-7689
E- :i be ist    i |
| IEICE-ICD |
Technical Committee on Integrated Circuits and Devices (IEICE-ICD) [Latest Schedule]
|
| Contact Address |
Toshimasa Matsuoka (Osaka University)
TEL 06-6879-7792,FAX 06-6879-7792
E-:   eeieng -u |
Last modified: 2010-05-27 18:47:09
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