ken-system: Advance Program - 2022-08-IEICE-ICD-IEICE-SDM-IST

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Technical Group on Information Sensing Technologies (IST)
Chair: Junichi Akita (Kanazawa Univ.) Vice Chair: Masayuki Ikebe (Hokkaido Univ.)

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Technical Committee on Silicon Device and Materials (IEICE-SDM)
Chair: Shunichiro Ohmi (Tokyo Inst. of Tech.) Vice Chair: Tatsuya Usami (ASM Japan)
Secretary: Tomoyuki Suwa (Tohoku Univ.), Taiji Noda (Panasonic)
Assistant: Takuji Hosoi (Kwansei Gakuin Univ.), Takuya Futase (SanDisk)

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Technical Committee on Integrated Circuits and Devices (IEICE-ICD)
Chair: Masafumi Takahashi (Kioxia) Vice Chair: Makoto Ikeda (Univ. of Tokyo)
Secretary: Kosuke Miyaji (Shinshu Univ.), Koji Nii (TSMC)
Assistant: Jun Shiomi (Osaka Univ.), Yoshiaki Yoshihara (キオクシア), Takeshi Kuboki (Sony Semiconductor Solutions)

DATE:
Mon, Aug 8, 2022 09:00 - 17:05
Tue, Aug 9, 2022 09:20 - 14:50
Wed, Aug 10, 2022 09:00 - 16:10

PLACE:

TOPICS:
Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications

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Mon, Aug 8 AM Image Sensor (09:00 - 11:30)
Chair: TBD
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(1)/IEICE-SDM 09:00 - 09:45
[Invited Talk]
A 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Oxide Based Full Trench Isolation for Large Full Well Capacity and High Quantum Efficiency
Koichiro Zaitsu, Akira Matsumoto, Mizuki Nishida, Yusuke Tanaka, Hirofumi Yamashita, Yosuke Satake (Sony Semiconductor Solutions), Takashi Watanabe, Kunihiko Araki, Naoki Nei (Sony Semiconductor Manufacturing), Keiichi Nakazawa, Junpei Yamamoto, Mutsuo Uehara (Sony Semiconductor Solutions), Hiroyuki Kawashima, Yusaku Kobayashi (Sony Semiconductor Manufacturing), Tomoyuki Hirano, Keiji Tatani (Sony Semiconductor Solutions)

(2)/IEICE-SDM 09:45 - 10:30
[Invited Talk]
Low-Noise Multi-Gate Pixel Transistor for Sub-Micron Pixel CMOS Image Sensors
Naohiko Kimizuka, Shota Kitamura, Akiko Honjo, Koichi Baba, Toshihiro Kurobe, Hideomi Kumano, Takuya Toyohuku (Sony Semiconductor Solutions), Kouhei Takeuchi, Shota Nishimura (Sony Semiconductor Manufacturing), Akihiko Kato, Tomoyuki Hirano, Yusuke Oike (Sony Semiconductor Solutions)

----- Break ( 15 min. ) -----

(3)/IEICE-ICD 10:45 - 11:30
[Invited Talk]
0.37 W, 143 dB Dynamic Range 1 Megapixel Backside-Illuminated Charge Focusing SPAD Image Sensor with Pixel-Wise Exposure Control and Adaptive Clocked Recharging
Yu Maehashi, Yasuharu Ota, Kazuhiro Morimoto, Tomoya Sasago, Mahito Shinohara, Yukihiro Kuroda, Wataru Endo, Shintaro Maekawa, Masanao Motoyama, Kenzo Tojima, Hiroyuki Tsuchiya, Ayman Abdelghafar, Kosei Uehira, Junji Iwata, Fumihiro Inui, Yasushi Matsuno, Katsuhito Sakurai, Takeshi Ichikawa (Canon)

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Mon, Aug 8 AM Memory Devices (11:30 - 12:15)
Chair: TBD
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(4)/IEICE-SDM 11:30 - 12:15
[Invited Talk]
Optimal Cell Structure/Operation Design of 3D Semicircular Split-gate Cells for Ultra-high-density Flash Memory
Tetsu Morooka (Kioxia)

----- ( 60 min. ) -----

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Mon, Aug 8 PM Ultra Low-Power (13:15 - 14:50)
Chair: TBD
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(5)/IEICE-ICD 13:15 - 14:00
[Invited Talk]
Research on Steep Slope "PN-Body Tied SOI-FET" for Ultra Low Power LSI
Jiro Ida, Takayuki Mori (Kanazawa IT)

(6)/IEICE-SDM 14:00 - 14:25
Evaluation of Steep Subthreshold Slope Device "Dual-gate PN-body Tied SOI-FET" for Ultra-low Voltage Operation
Haruki Yonezaki, Jiro Ida, Takayuki Mori (KIT), Koichiro Ishibashi (UEC)

(7)/IEICE-ICD 14:25 - 14:50
Sub-50-mV Input Boost Converter for Extremely Low-Voltage Thermal Energy Harvesting
Hikaru Sebe, Daisuke Kanemoto, Tetsuya Hirose (Osaka Univ.)

----- Break ( 15 min. ) -----

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Mon, Aug 8 PM Security & Analog1 (15:05 - 17:05)
Chair: TBD
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(8)/IEICE-ICD 15:05 - 15:30
Evaluation of Backside Voltage Disturbance Impacts and IC Chip Response in Flip Chip Packaging
Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa (Kobe Univ.), Kikuo Muramatsu (e-SYNC), Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo (Megachips), Takuji Miki, Makoto Nagata (Kobe Univ.)

(9)/IEICE-ICD 15:30 - 15:55
Evaluation of Low-Latency Cryptography MANTIS based Low-Power oriented Tamper-Resistant Circuit
Kosuke Hamaguchi, Shu Takemoto, Yusuke Nozaki, Masaya Yoshikawa (Meijo Univ.)

(10)/IEICE-ICD 15:55 - 16:20
A cryogenic digital-to-analog converter for high-fidelity control of large-scale qubit arrays
Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.)

(11)/IEICE-ICD 16:20 - 17:05
[Invited Talk]
A 3.3-GHz 4.6-mW Fractional-N Type-II Hybrid Switched-Capacitor Sampling PLL Using CDAC-Embedded Digital Integral Path with -80-dBc Reference Spur
Zule Xu, Masaru Osada, Tetsuya Iizuka (UTokyo)

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Tue, Aug 9 AM Sensor & Cryogenic CMOS (09:20 - 12:15)
Chair: TBD
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(12)/IEICE-ICD 09:20 - 10:05
[Invited Talk]
A low-power low-noise magnetoimpedance-based magnetometer with digital calibration technique
Ippei Akita (AIST), Takeshi Kawano, Hitoshi Aoyama, Shunichi Tatematsu (Aichi Steel Corp.), Masakazu Hioki (AIST)

(13)/IEICE-ICD 10:05 - 10:50
[Invited Talk]
A 38µm Range Precision Time-of-Flight CMOS Range Line Imager with Gating Driver Jitter Reduction Using Charge-Injection Pseudo Photocurrent Reference
Keita Yasutomi, Tatsuki Furuhashi, Koki Sagawa, Taishi Takasawa, Keiichiro Kagawa, Shoji Kawahito (Shizuoka Univ.)

----- Break ( 15 min. ) -----

(14)/IEICE-SDM 11:05 - 11:50
[Invited Talk]
Effect of Conduction Band Edge States on Coulomb-Limiting Electron Mobility in Cryogenic MOSFET Operation
Hiroshi Oka, Takumi Inaba, Shota Iizuka, Hidehiro Asai, Kimihiko Kato, Takahiro Mori (AIST)

(15)/IEICE-SDM 11:50 - 12:15
TCAD Analysis for threshold voltage increase in cryogenic MOSFET operation
Hidehiro Asai, Takumi Inaba, Junichi Hattori, Koichi Fukuda, Hiroshi Oka, Takahiro Mori (AIST)

----- ( 60 min. ) -----

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Tue, Aug 9 PM Sensor Application (13:15 - 14:50)
Chair: TBD
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(16)/IST 13:15 - 14:00
[Invited Talk]
Quantification of perception using Psychophysical Methods
Sae Kaneko (Hokkaido Univ.)

(17)/IST 14:00 - 14:25
High-precision small capacitance difference measurement using proximity capacitance sensor
Yoshiaki Watanabe, Yuki Sugama, Yoshinobu Shiba, Rihito Kuroda, Yasuyuki Shirai, Shigetoshi Sugawa (Tohoku Univ.)

(18)/IST 14:25 - 14:50
Evaluation of simultaneous depth and stress measurement by array sensing using indenter physics
Ayato Nozu, Rikuo Yugeta, Yuri Kanazawa, Masayuki Ikebe (Hokkaido Univ.)

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Wed, Aug 10 AM Analog 2 (09:00 - 12:15)
Chair: TBD
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(19)/IEICE-ICD 09:00 - 09:45
[Invited Talk]
A 39-GHz CMOS Bi-Directional Doherty Phased-Array Beamformer Using Shared-LUT DPD with Inter-Element Mismatch Compensation Technique for 5G Base-Station
Zheng Li, Jian Pang, Yi Zhang, Yudai Yamazaki, Qiaoyu Wang, Peng Luo, Weichu Chen, Yijing Liao, Minzhe Tang, Zhengyan Guo, Yun Wang, Xi Fu, Dongwon You (Tokyo Tech), Naoki Oshima, Shinichi Hori, Kazuaki Kunihiro (NEC), Atsushi Shirane, Kenichi Okada (Tokyo Tech)

(20)/IEICE-ICD 09:45 - 10:30
[Invited Talk]
A Power-Efficient Harmonic-Selection Phased-Array Receiver Supporting 24.25-71GHz Operation With 36dB Inter-Band Blocker Rejection
Jian Pang, Yi Zhang, Zheng Li, Minzhe Tang, Yijing Liao, Ashbir Aviat Fadila, Atsushi Shirane, Kenichi Okada (Tokyo Tech)

----- Break ( 15 min. ) -----

(21)/IEICE-ICD 10:45 - 11:30
[Invited Talk]
Low Power and Radiation-Hardened Ka-Band Transceiver for Small Satellite
Atsushi Shirane (Tokyo Tech)

(22)/IEICE-ICD 11:30 - 12:15
[Invited Talk]
A 28-GHz Fully-Passive Retro-Reflective Phased-Array Backscattering Transceiver for 5G Network with 24-GHz Beam-Steered Wireless Power Transfer
Michihiro Ide, Keito Yuasa, Sena Kato, Dongwon You, Ashbir Aviat Fadila, Jian Pang, Atsushi Shirane, Kenichi Okada (Titech)

----- ( 60 min. ) -----

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Wed, Aug 10 PM AI & Neural Network (13:15 - 16:10)
Chair: TBD
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(23)/IEICE-ICD 13:15 - 14:00
[Invited Talk]
Introducing a new DNN inference chip (Hiddenite) based on hidden network theory
Masato Motomura (TokyoTech)

(24)/IST 14:00 - 14:45
[Invited Talk]
Algorithm-architecture co-optimization for edge AI applications
Kota Ando (Hokkaido Univ.)

----- Break ( 15 min. ) -----

(25)/IEICE-ICD 15:00 - 15:45
[Invited Talk]
A CMOS Image Sensor and an AI Accelerator for Realizing Edge-Computing-Based Surveillance Camera Systems
Fukashi Morishita, Norihito Kato, Satoshi Okubo, Takao Toi, Mitsuru Hiraki, Sugako Otani, Hideaki Abe, Yuji Shinohara, Hiroyuki Kondo (Renesas Electronics)

(26)/IEICE-ICD 15:45 - 16:10
IC with Integrated Imager and Ultra-Low Latency All-Digital In-Imager 2D Binary Convolutional Neural Network Accelerator for Image Classification
Wang Ruizhi, Takamiya Makoto (The Univ. of Tokyo)

# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.
Invited Talk will have 40 minutes for presentation and 5 minutes for discussion.

# CONFERENCE SPONSORS:
- This conference is co-sponsored by IEEE SSCS Japan Chapter, IEEE SSCS Kansai Chapter and The Japan Society of Applied Physics.

=== Technical Group on Information Sensing Technologies (IST) ===
# FUTURE SCHEDULE:

Thu, Sep 22, 2022: Kikai-Shinko-Kaikan Bldg. [Fri, Aug 19]

=== Technical Committee on Silicon Device and Materials (IEICE-SDM) ===

# SECRETARY:
SDM Secretary: MORI Takahiro(National Institute of AIST)
Tel +81-29-849-1149
E-Mail