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Technical Group on Information Sensing Technologies (IST)
Chair: Takayuki Hamamoto (Tokyo University of Science) Vice Chair: Hiroshi Ohtake (NHK), Junichi Akita (Kanazawa Univ.)
Secretary: Masayuki Ikebe (Hokkaido Univ.)

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Technical Committee on Silicon Device and Materials (IEICE-SDM)
Chair: Takahiro Shinada (Tohoku Univ.) Vice Chair: Hiroshige Hirano (TowerJazz Panasonic)
Secretary: Hiroya Ikeda (Shizuoka Univ.), Tetsu Morooka (TOSHIBA MEMORY)
Assistant: Takahiro Mori (AIST), Nobuaki Kobayashi (Nihon Univ.)

===============================================
Technical Committee on Integrated Circuits and Devices (IEICE-ICD)
Chair: Hideto Hidaka (Renesas) Vice Chair: Makoto Nagata (Kobe Univ.)
Secretary: Takashi Hashimoto (Panasonic), Masanori Natsui (Tohoku Univ.)
Assistant: Hiroyuki Ito (Tokyo Inst. of Tech.), Masatoshi Tsuge (Socionext), Tetsuya Hirose (Kobe Univ.)

DATE:
Tue, Aug 7, 2018 09:00 - 17:10
Wed, Aug 8, 2018 09:00 - 17:40
Thu, Aug 9, 2018 09:30 - 15:20

PLACE:
Graduate School of Information and Technology, Kokkaido Univ. M Bldg. M151(http://www.ist.hokudai.ac.jp/eng/access/)

TOPICS:


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Tue, Aug 7 AM (09:00 - 10:35)
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(1)/IST 09:00 - 09:25
A model and circuit for an early auditory system based on vestibulo-ocular reflex
Tkahiro Ikegami, Masayuki Ikebe, Shinya Takamaeda, Masato Motomura, Tetsuya Asai (Hokkaido Univ.)

(2)/IST 09:25 - 09:50
Wide-band CMOS terahertz imaging pixel
Yuri Kanazawa, Shota HIramatsu, Eiichi Sano, Sayuri Yokoyama, Masayuki Ikebe (Hokkaido Univ)

(3)/IST 09:50 - 10:35
[Invited Talk]
Nano probe technology for sensing and its applications
Kazuhisa Sueoka (Hokkaido Univ)

----- Break ( 10 min. ) -----

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Tue, Aug 7 AM (10:45 - 11:55)
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(4)/IEICE-ICD 10:45 - 11:30
[Invited Talk]
Energy Harvesting Beat Sensors and Potential Applications
-- Low Power, Low cost and High precision IoT Sensors --
Koichiro Ishibashi (UEC)

(5)/IEICE-ICD 11:30 - 11:55
Comparison of Sensitivity to Soft Errors of NMOS and PMOS Transistors by Using Three Types of Stacking Latches in an FDSOI process
Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (KIT)

----- Lunch Break ( 60 min. ) -----

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Tue, Aug 7 PM (12:55 - 14:50)
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(6)/IEICE-SDM 12:55 - 13:40
[Invited Talk]
Development of SiGe-MEMS-on-CMOS technology for ultra-low-power inertial sensors
Hideyuki Tomizawa, Yoshihiko Kurui (Toshiba), Ippei Akita (AIST), Akira Fujimoto, Tomohiro Saito, Akihiro Kojima, Hideki Shibata (Toshiba)

(7)/IEICE-SDM 13:40 - 14:25
[Invited Talk]
Fabrication and Characterization of SOI-CMOS Using Minimal-Fab and Mega-Fab Hybrid Process
Yongxun Liu (AIST)

(8)/IEICE-SDM 14:25 - 14:50
Experiment of Ultralow Voltage Rectification by Super Steep SS "PN-Body Tied SOI-FET"
Shun Momose, Jiro Ida, Takuya Yamada, Takayuki Mori, Kenji Itoh (KIT), Koichiro Ishibashi (UEC), Yasuo Arai (KEK)

----- Break ( 10 min. ) -----

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Tue, Aug 7 PM (15:00 - 15:50)
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(9)/IEICE-ICD 15:00 - 15:25
A 0.6V 9bit PWM Differential Arthmetic Circuit
Fumiya Kojima, Tomochika Harada (Yamagata Univ)

(10)/IEICE-ICD 15:25 - 15:50
A 65nm SOTB Based-On Code-Modulated Synchronized-OOK Transmitter for Normally-Off Wireless Sensor Networks
Van-Trung Nguyen, Ryo Ishikawa, Koichiro Ishibashi (The UEC)

----- Break ( 10 min. ) -----

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Tue, Aug 7 PM (16:00 - 17:10)
----------------------------------------

(11)/IEICE-ICD 16:00 - 16:45
[Invited Talk]
A Battery Management System with a Low-Power State of Charge Monitoring Method and an Intermittently Enabled Coulomb Counter for IoT Devices
Ken-ichi Kawasaki, Jun-ichi Nagata, Hiroyuki Nakamoto (Fujitsu Labs.)

(12)/IEICE-ICD 16:45 - 17:10
Power Consumption Estimation by Die Temperature for Processors Implemented on FPGA
Hiroaki Kaneko, Akinori Kanasugi (Tokyo Denki Univ.)

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Wed, Aug 8 AM (09:00 - 10:10)
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(13)/IEICE-SDM 09:00 - 09:45
[Invited Talk]
Research trends of resistance change devices using oxide materials
-- Application to non-volatile memory and neuromorphic device --
Hisashi Shima, Makoto Takahashi, Yasuhisa Naitoh, Hiroyuki Akinaga (AIST)

(14)/IEICE-SDM 09:45 - 10:10
Understanding Temperature Effect on Subthreshold Slope Variability in Bulk and SOTB MOSFETs
Shuang Gao, Tomoko Mizutani, Kiyoshi Takeuchi, Masaharu Kobayashi, Toshiro Hiramoto (Univ. Tokyo)

----- Break ( 10 min. ) -----

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Wed, Aug 8 AM (10:20 - 11:50)
----------------------------------------

(15)/IEICE-SDM 10:20 - 11:05
[Invited Talk]
Neuromorphic Operation using an Atom/Ion Movement-Type Device
Takeo Ohno (Oita Univ.)

(16)/IST 11:05 - 11:50
[Invited Talk]
Extremely low power device using crystalline oxide semiconductor
Kiyoshi Kato (SEL)

----- Lunch Break ( 60 min. ) -----

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Wed, Aug 8 PM (12:50 - 14:25)
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(17)/IEICE-ICD 12:50 - 13:15
Measurements and Analysis of Power Supply Noise in Digital IC Chip
Kosuke Jike, Akihiro Tsukioka, Ryohei Sawada, Koh Watanabe, Noriyuki Miura, Makoto Nagata (Kobe Univ)

(18)/IEICE-ICD 13:15 - 13:40
Highly Symmetrical 10T 2-Read/Write Dual-port SRAM Bitcell Design In 28nm High-k/Metal-gate Planar Bulk CMOS Technology
Yuichiro Ishii, Miki Tanaka, Makoto Yabuuchi, Yohei Sawada, Shinji Tanaka, Koji Nii (Renesas), Tien Yu Lu, Chun Hsien Huang, Shou Sian Chen, Yu Tse Kuo, Ching Cheng Lung, Osbert Cheng (UMC)

(19)/IEICE-ICD 13:40 - 14:25
[Invited Talk]
CMOS Annealing Machine for Combinatorial Optimization Problems
Masanao Yamaoka (Hitachi)

----- Break ( 10 min. ) -----

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Wed, Aug 8 PM (14:35 - 17:40)
----------------------------------------

(20)/IEICE-SDM 14:35 - 15:00
Proposal of reconfigurable system LSI with BiCS technology
Shigeyoshi Watanabe (Shonan Insti. of Tech.)

(21)/IEICE-SDM 15:00 - 15:25
Study of new stacked type logic circuit scheme with fabrication technology of 3D NAND flash memory.
-- Comparison with conventional LUT system and planar type --
Fumiya Suzuki, Sigeyoshi Watanabe (Shonan Inst. of Tech.)

----- Break ( 15 min. ) -----

(22) 15:40 - 17:40


----------------------------------------
Thu, Aug 9 AM (09:30 - 11:45)
----------------------------------------

(23)/IEICE-ICD 09:30 - 10:15
[Invited Talk]
Flexible sensing system and venture startup
Shusuke Yoshimoto (PGV Inc.)

(24)/IEICE-ICD 10:15 - 11:00
[Invited Talk]
Non-Contact Unobtrusive Sensing of Multiple Vital Signals Using Capacitive Coupling
-- Introduction of Cutting-Edge Researches --
Akinori Ueno (Tokyo Denki Univ.)

(25)/IEICE-ICD 11:00 - 11:45
[Invited Talk]
Wearable Monitoring Systems for Heart Rate Variability Analysis
Shintaro Izumi (Osaka Univ.)

----- Lunch Break ( 60 min. ) -----

----------------------------------------
Thu, Aug 9 PM (12:45 - 13:35)
----------------------------------------

(26)/IEICE-ICD 12:45 - 13:10
Study of Impact of BTI's Local Layout Effect Including Recovery Effect on Various Standard-Cells in 10nm FinFET
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii (Renesas)

(27)/IEICE-ICD 13:10 - 13:35
12-nm Fin-FET 3.0G-search/s 80-bit x 128-entry Dual-port Ternary CAM
Makoto Yabuuchi, Masao Morimoto, Koji Nii, Shinji Tanaka (Renesas)

----- Break ( 10 min. ) -----

----------------------------------------
Thu, Aug 9 PM (13:45 - 15:20)
----------------------------------------

(28)/IEICE-SDM 13:45 - 14:10
Effect of multiple stress application in post-fabrication cell stability self-improvement in SRAM cell array
Tomoko Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto (Univ. of Tokyo)

(29)/IEICE-SDM 14:10 - 14:35
Device and Process Design for HfO2-Based Ferroelectric Tunnel Junction Memory with Large Tunneling Electroresistance Effect and Multi-level Cell
Masaharu Kobayashi, Yusaku Tagawa, Mo Fei, Toshiro Hiramoto (Univ. Tokyo)

(30)/IEICE-SDM 14:35 - 15:20
[Invited Talk]
Cu Atom Switch Technology toward 28nm Nonvolatile Programmable Logic
Ryusuke Nebashi, Naoki Banno, Makoto Miyamura, Ayuka Morioka, Bai Xu, Koichiro Okamoto, Noriyuki Iguchi, Hideaki Numata, Hiromitsu Hada, Tadahiko Sugibayashi, Toshitsugu Sakamoto, Munehiro Tada (NEC)

# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.
Invited Talk will have 40 minutes for presentation and 5 minutes for discussion.

# CONFERENCE SPONSORS:
- This conference is co-sponsored by The Japan Society of Applied Physics, IEEE SSCS Japan Chapter and IEEE SSCS Kansai Chapter.


=== Technical Group on Information Sensing Technologies (IST) ===
# FUTURE SCHEDULE:

Tue, Sep 25, 2018: Kikai-Shinko-Kaikan Bldg. , Topics: Image Sensor , etc.
Tue, Nov 13, 2018: Shonan Institute of Technology [Thu, Sep 27], Topics: 3D Imaging, Hyper-Realistic Imaging, etc.
Wed, Nov 28, 2018: Tamachi Campus, TITECH , Topics: 4th International Workshop on Image Sensors and Imaging Systems (IWISS2018)

# SECRETARY:
Masayuki Ikebe (Hokkaido Univ.)
E-mail: ibeisti

=== Technical Committee on Silicon Device and Materials (IEICE-SDM) ===

# SECRETARY:
Takahiro Mori (National Institute of Advanced Industrial Science and Technology)
E-mail: -aist
Tetsu Morooka (Toshiba Memory Corp.)
E-mail: ba

=== Technical Committee on Integrated Circuits and Devices (IEICE-ICD) ===

# SECRETARY:
Masatoshi Tsuge (Socionext Inc.)
E-mail: gecioxt
Takashi Hashimoto (Panasonic Corp.)
E-mail: 1967pac


Last modified: 2018-06-22 11:39:02


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