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===============================================
Technical Group on Information Sensing Technologies (IST)
Chair: Shigetoshi Sugawa (Tohoku Univ.)

DATE:
Fri, Sep 18, 2015 09:15 - 17:10

PLACE:
(http://www.jspmi.or.jp/)

TOPICS:


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Fri, Sep 18 AM (09:15 - 17:10)
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(1) 09:15 - 09:45
A Low Noise and High Sensitivity Image Sensor with Imaging and Phase-Difference Detection AF in All Pixels
Masahiro Kobayashi, Michiko Johnson, Yoichi Wada, Hiromasa Tsuboi, Hideaki Takada, Kenji Togo, Takafumi Kishi, Hidekazu Takahashi, Takeshi Ichikawa, Shunsuke Inoue (Canon)

(2) 09:45 - 10:15
A 4M pixel full-PDAF CMOS Image Sensor with 1.58μm 2×1 On-Chip Micro-Split-Lens Technology
Atsushi Morimitsu, Isao Hirota, Sozo Yokogawa, Isao Ohdaira, Masao Matsumura, Hiroaki Takahashi, Toshio Yamazaki, Hideki Oyaizu (Sony), Yalcin Incesu, Muhammad Atif (Sony Deutschland), Yoshikazu Nitta (Sony)

(3) 10:15 - 10:45
A 3D stacked CMOS image sensor with 16Mpixel global-shutter mode using 4 million interconnections
Toru Kondo, Yoshiaki Takemoto, Kenji Kobayashi, Mitsuhiro Tsukimura, Naohiro Takazawa, Hideki Kato, Shunsuke Suzuki, Jun Aoki, Haruhisa Saito, Yuichi Gomi, Seisuke Matsuda, Yoshitaka Tadaki (Olympus)

(4) 10:45 - 11:15
The source decomposition of Dark FPN and its improvement by Stacked CIS process
Yuichiro Yamashita, Wen-hau Wu, Wen-jen Chiang, Chi-hsien Chung, Ren-jie Lin, Jhy-jyi Sze, Jen-cheng Liu, Cheng-hsien Tseng, Hirohumi Sumi (TSMC), Sho-gwo Wuu

(5) 11:15 - 11:45
3D Stacked Imager Featuring Inductive Coupling Channels for High-speed/Low Noise Image Transfer
Masayuki Ikebe, Daisuke Uchida (Hokkaido Univ.), Yasuhiro Take (Keio Univ.), Makito Someya, Satoshi Chikuda, Kento Matsuyama, Tetsuya Asai (Hokkaido Univ.), Tadahiro Kuroda (Keio Univ.), Masato Motomura (Hokkaido Univ.)

----- Lunch Break ( 45 min. ) -----

(6) 12:30 - 13:00
[Invited Talk]
*
Atsushi Kobayashi (Huawei Japan)

(7) 13:00 - 13:30
A 14-bit, 33-Mpixel, 120-fps Image Sensor with DMOS Capacitors in 90-nm/65-nm CMOS
Toshio Yasue, Kazuya Kitamura, Toshihisa Watabe, Hiroshi Shimamoto (NHK), Tomohiko Kosugi, Takashi Watanabe, Satoshi Aoyama (Brookman Technology), Makoto Monoi (Toshiba Corporation), Zhiheng Wei, Shoji Kawahito (Shizuoka Univ.)

(8) 13:30 - 14:00
Preliminary Experiment for Precise and Dynamic Digital Calibration for Two-Stage Cyclic ADC Suitable for 33-Mpixel 120-fps 8K Super Hi-Vision CMOS Image Sensor
Toshihisa Watabe, Kazuya Kitamura (NHK), Tomohiko Kosugi (Brookman), Hiroshi Ohtake, Hiroshi Shimamoto (NHK), Shoji Kawahito (Shizuoka Univ./Brookman)

(9) 14:00 - 14:30
High-Sensitivity Image Sensor with Stacked Structure comprising Crystalline Selenium Photoconductor, Crystalline OS FET, and CMOS FET
Yoshiyuki Kurokawa, Takashi Nakagawa, Shuhei Maeda, Takuro Ohmaru, Takayuki Ikeda, Yasutaka Suzuki, Naoto Yamade, Hidekazu Miyairi (SEL), Shigeyuki Imura, Kenji Kikuchi, Kazunori Miyakawa, Hiroshi Ohtake, Misao Kubota (NHK), Makoto Ikeda, Shunpei Yamazaki (SEL)

(10) 14:30 - 15:00
The performance evaluation of fully depleted SOI pixel detector with backgate surface potential pinning
Hiroki Kamehama, Sumeet Shrestha, Keita Yasutomi, Keiichiro Kagawa (Shizuoka Univ.), Ayaki Takeda, Takeshi Go Tsuru (Kyoto Univ.), Yasuo Arai (KEK), Shoji Kawahito (Shizuoka Univ.)

----- Break ( 10 min. ) -----

(11) 15:10 - 15:40
Toward 10 Gfps: Factors Limiting the Frame Rate of the BSI MCG Image Sensor
Dao Vu Truong Son, Quang Nguyen Anh, Kotaro Kitagawa, Kazuhiro Shimonomura, Takeharu Etoh (Ritsumeikan Univ.), Yoshinari Kamakura, Natsumi MInamitani (Osaka Univ.)

(12) 15:40 - 16:10
Investigation of Implantation Damage Recovery using Microwave Annealing for High Performance Image Sensing Devices.
Masatoshi Kimura (RSMC), Tadashi Yamaguchi (Renesas Electronics), Takashi Kuroi (RSMC)

(13) 16:10 - 16:40
A CMOS Image Sensor with 240μV/e- Conversion Gain, 200ke- Full Well Capacity and 190-1000nm Spectral Response
Satoshi Nasuno, Shunichi Wakashima, Fumiaki Kusuhara, Rihito Kuroda, Shigetoshi Sugawa (Tohoku Univ.)

(14) 16:40 - 17:10
Analysis and Reduction of Floating Diffusion Capacitance Components and Application to High Sensitivity and High Full Well Capacity CMOS Image Sensor
Fumiaki Kusuhara, Shunichi Wakashima, Satoshi Nasuno, Rihito Kuroda, Shigetoshi Sugawa (Tohoku Univ.)

# Information for speakers
General Talk will have 25 minutes for presentation and 5 minutes for discussion.
Invited Talk will have 25 minutes for presentation and 5 minutes for discussion.


=== Technical Group on Information Sensing Technologies (IST) ===
# FUTURE SCHEDULE:

Thu, Oct 15, 2015: [Wed, Aug 19]
Fri, Nov 20, 2015: S-Port, Hamamatsu Campus, Shizuoka Univ. [Mon, Sep 28], Topics: Workshop on microscopy, biology, medicine, and advanced CMOS imagers


Last modified: 2015-08-06 10:28:57


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