| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2021-03-26
09:00 |
Tokyo |
Online |
A 64M CMOS Image Sensor using 0.7um pixel with high FWC and switchable conversion gain
Y. Jay Jung, Vincent C. Venezia, Sangjoo Lee, Chun Yung Ai, Yibo Zhu, King W. Yeung, Geunsook Park, Woonil Choi, Zhiqiang Lin, Wu-Zang Yang, Alan Chih-Wei Hsiung, Lindsay Grant (OmniVision Technologies, Inc.) |
This paper presents a 64 mega-pixel, backside illuminated, CMOS image sensor using a 0.7um pixel pitch with a 7.0ke- lin... [more] |
IST2021-8
pp.1-4 |
| IST |
2021-03-26
09:25 |
Tokyo |
Online |
Evaluation of the effect of the 3D defect distribution created by plasma process on the dark current characteristics
Yoshihiro Sato, Takayoshi Yamada, Kazuko Nishimura, Masayuki Yamasaki, Masashi Murakami (Panasonic), Keiichiro Urabe, Koji Eriguchi (Kyoto Univ.) |
Plasma processing is widely used in manufacturing present-day ULSI circuits. During plasma processing, defects are creat... [more] |
IST2021-9
pp.5-8 |
| IST |
2021-03-26
09:50 |
Tokyo |
Online |
[Invited Talk]
History of Pixel Shrinkage for Mobile Sensors
Naoyuki Miyashita (SEC) |
[more] |
IST2021-10
pp.9-12 |
| IST |
2021-03-26
10:45 |
Tokyo |
Online |
Noise reduction in CMOS image sensors using analog correlated multiple sampling with high density capacitors
Shunta Kamoshita, Manabu Suzuki (Tohoku Univ.), Rihito Kuroda, Shigetoshi Sugawa (Tohoku Univ) |
[more] |
IST2021-11
pp.13-16 |
| IST |
2021-03-26
11:05 |
Tokyo |
Online |
A Global Shutter Wide Dynamic Range Soft X-Ray CMOS Image Sensor with 45μm-Thick Backside-Illuminated Pinned Photodiode and Two-Stage LOFIC
Hiroya Shike, Rihito Kuroda, Ryota Kobayashi, Maasa Murata, Yasuyuki Fujihara, Manabu Suzuki, Shoma Harada (Tohoku Univ.), Taku Shibaguchi, Naoya Kuriyama (LAPIS Semiconductor), Takaki Hatsui (RIKEN), Jun Miyawaki (The Univ. of Tokyo/QST), Tetsuo Harada (Univ. of Hyogo), Yuichi Yamasaki (NIMS), Takeo Watanabe (Univ. of Hyogo), Yoshihisa Harada (The Univ. of Tokyo), Shigetoshi Sugawa (Tohoku Univ.) |
[more] |
IST2021-12
pp.17-20 |
| IST |
2021-03-26
11:30 |
Tokyo |
Online |
Study of High-SNR Pixel for CMOS Image Sensor Applicable to Image Recognition
Toya Sasaki, Masayoshi Sirahata, Shunsuke Okura (Ritsumeikan Univ.) |
For the demand to high dynamic range (HDR) technology of CMOS image sensors, LOFIC is considered to be one of solutions.... [more] |
IST2021-13
pp.21-24 |
| IST |
2021-03-26
12:50 |
Tokyo |
Online |
A Back Illuminated 10μm SPAD Pixel Array Comprising Full Trench Isolation and Cu-Cu Bonding with Over 14% PDE at 940nm
Kyosuke Ito, Yusuke Otake, Yoshiaki Kitano, Akira Matsumoto, Junpei Yamamoto, Takayuki Ogasahara, Hiroki Hiyama, Ryusei Naito, Kohei Takeuchi, Takanori Tada, Kosaku Takabayashi, Hajime Nakayama, Keiji Tatani, Tomoyuki Hirano, Toshifumi Wakano (SONY) |
A state of the art Back Illuminated (BI) Single Photon Avalanche Diode (SPAD) array sensor realized via a 90nm CMOS proc... [more] |
IST2021-14
pp.25-28 |
| IST |
2021-03-26
13:15 |
Tokyo |
Online |
A 189×600 Back-Illuminated Stacked SPAD Direct Time-of-Flight Depth Sensor for Automotive LiDAR Systems
Oichi Kumagai, Junichi Ohmachi, Masao Matsumura, Shinichiro Yagi, Kenichi Tayu (Sony Semiconductor Solutions), Keitaro Amagawa (Sony LSI Design), Tomohiro Matsukawa, Osamu Ozawa, Daisuke Hirono, Yasuhiro Shinozuka, Ryutaro Homma (Sony Semiconductor Solutions), Kumiko Mahara (Sony LSI Design), Toshio Ohyama, Yousuke Morita, Shohei Shimada (Sony Semiconductor Solutions), Takahisa Ueno (Sony Depthsensing Solutions), Akira Matsumoto, Yusuke Otake, Toshifumi Wakano, Takashi Izawa (Sony Semiconductor Solutions) |
[more] |
IST2021-15
pp.29-32 |
| IST |
2021-03-26
13:45 |
Tokyo |
Online |
Low power consumption and high resolution 1280X960 Gate Assisted Photonic Demodulator pixel for indirect Time of flight
Yoshiki Ebiko (SSS) |
[more] |
IST2021-16
pp.33-37 |
| IST |
2021-03-26
14:10 |
Tokyo |
Online |
A 250fps 124dB Dynamic-Range SPAD Image Sensor Stacked with Pixel-Parallel Photon Counter Employing Subframe Extrapolating Architecture for Motion Artifact Suppression
Kazuki Hizu, Jun Ogi, Takafumi Takatsuka, Yutaka Inaoka, Hongbo Zhu, Yasuhisa Tochigi, Yoshiaki Tashiro, Fumiaki Sano (Sony Semiconductor Solutions), Yusuke Murakawa, Makoto Nakamura (Sony Semiconductor Manufacturing), Yusuke Oike (Sony Semiconductor Solutions) |
[more] |
IST2021-17
pp.39-42 |
| IST |
2021-03-26
15:00 |
Tokyo |
Online |
[Invited Talk]
Evolving Image Sensor Architecture through Stacking Devices
Yusuke Oike (Sony) |
The evolution of CMOS image sensors and the prospects utilizing advanced imaging technologies promise to improve our qua... [more] |
IST2021-18
p.43 |
| IST |
2021-03-26
15:50 |
Tokyo |
Online |
|
[more] |
IST2021-19
pp.45-48 |
| IST |
2021-03-26
16:30 |
Tokyo |
Online |
A 4.6um, 512 x 512, Ultra-Low Power Stacked Digital Pixel Sensor with Triple Quantization and 127dB Dynamic Range
Toshiyuki Isozaki, Kazuya Mori, Rimon Ikeno, Masayuki Uno, Ken Miyauchi, Isao Takayanagi, Junichi Nakamura (BRILLNICS), Lyle Bainbridge, Andrew Berkovich, Song Chen, Wei Gao, Tsung-Hsun Tsai, Chiao Liu (Facebook) |
[more] |
IST2021-20
pp.49-52 |
| IST |
2021-03-26
16:55 |
Tokyo |
Online |
A 1-inch 17Mpixel 1000fps Block-Controlled Coded-Exposure Back-Illuminated Stacked CMOS Image Sensor for Computational Imaging and Adaptive Dynamic Range Control
Yojiro Tezuka, Tomoki Hirata, Hironobu Murata, Hideaki Matsuda, Shiro Tsunai (Nikon) |
This is a report of a 4k×4k, 2.7μm pixel, back-illuminated stacked CIS with controllable integration time for
each pix... [more] |
IST2021-21
pp.53-56 |
|