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| Chair |
|
Hideto Hidaka (Renesas) |
| Vice Chair |
|
Makoto Nagata (Kobe Univ.) |
| Secretary |
|
Takashi Hashimoto (Panasonic), Masanori Natsui (Tohoku Univ.) |
| Assistant |
|
Hiroyuki Ito (Tokyo Inst. of Tech.), Masatoshi Tsuge (Socionext), Tetsuya Hirose (Kobe Univ.) |
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|
|
| Chair |
|
Takayuki Hamamoto (Tokyo University of Science) |
| Vice Chair |
|
Hiroshi Ohtake (NHK), Junichi Akita (Kanazawa Univ.) |
| Secretary |
|
Masayuki Ikebe (Hokkaido Univ.) |
|
|
|
| Chair |
|
Takahiro Shinada (Tohoku Univ.) |
| Vice Chair |
|
Hiroshige Hirano (TowerJazz Panasonic) |
| Secretary |
|
Hiroya Ikeda (Shizuoka Univ.), Tetsu Morooka (TOSHIBA MEMORY) |
| Assistant |
|
Takahiro Mori (AIST), Nobuaki Kobayashi (Nihon Univ.) |
|
| Conference Date |
Tue, Aug 7, 2018 09:00 - 17:10
Wed, Aug 8, 2018 09:00 - 17:40
Thu, Aug 9, 2018 09:30 - 15:20 |
| Topics |
|
| Conference Place |
Graduate School of Information and Technology, Kokkaido Univ. M Bldg. M151 |
| Transportation Guide |
http://www.ist.hokudai.ac.jp/eng/access/ |
| Sponsors |
This conference is co-sponsored by The Japan Society of Applied Physics, IEEE SSCS Japan Chapter and IEEE SSCS Kansai Chapter.
|
Tue, Aug 7 AM
09:00 - 10:35 |
(1)
IST |
09:00-09:25 |
A model and circuit for an early auditory system based on vestibulo-ocular reflex |
Tkahiro Ikegami, Masayuki Ikebe, Shinya Takamaeda, Masato Motomura, Tetsuya Asai (Hokkaido Univ.) |
(2)
IST |
09:25-09:50 |
Wide-band CMOS terahertz imaging pixel |
Yuri Kanazawa, Shota HIramatsu, Eiichi Sano, Sayuri Yokoyama, Masayuki Ikebe (Hokkaido Univ) |
(3)
IST |
09:50-10:35 |
[Invited Talk]
Nano probe technology for sensing and its applications |
Kazuhisa Sueoka (Hokkaido Univ) |
| |
10:35-10:45 |
Break ( 10 min. ) |
Tue, Aug 7 AM
10:45 - 11:55 |
(4)
IEICE-ICD |
10:45-11:30 |
[Invited Talk]
Energy Harvesting Beat Sensors and Potential Applications
-- Low Power, Low cost and High precision IoT Sensors -- |
Koichiro Ishibashi (UEC) |
(5)
IEICE-ICD |
11:30-11:55 |
Comparison of Sensitivity to Soft Errors of NMOS and PMOS Transistors by Using Three Types of Stacking Latches in an FDSOI process |
Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (KIT) |
| |
11:55-12:55 |
Lunch Break ( 60 min. ) |
Tue, Aug 7 PM
12:55 - 14:50 |
(6)
IEICE-SDM |
12:55-13:40 |
[Invited Talk]
Development of SiGe-MEMS-on-CMOS technology for ultra-low-power inertial sensors |
Hideyuki Tomizawa, Yoshihiko Kurui (Toshiba), Ippei Akita (AIST), Akira Fujimoto, Tomohiro Saito, Akihiro Kojima, Hideki Shibata (Toshiba) |
(7)
IEICE-SDM |
13:40-14:25 |
[Invited Talk]
Fabrication and Characterization of SOI-CMOS Using Minimal-Fab and Mega-Fab Hybrid Process |
Yongxun Liu (AIST) |
(8)
IEICE-SDM |
14:25-14:50 |
Experiment of Ultralow Voltage Rectification by Super Steep SS "PN-Body Tied SOI-FET" |
Shun Momose, Jiro Ida, Takuya Yamada, Takayuki Mori, Kenji Itoh (KIT), Koichiro Ishibashi (UEC), Yasuo Arai (KEK) |
| |
14:50-15:00 |
Break ( 10 min. ) |
Tue, Aug 7 PM
15:00 - 15:50 |
(9)
IEICE-ICD |
15:00-15:25 |
A 0.6V 9bit PWM Differential Arthmetic Circuit |
Fumiya Kojima, Tomochika Harada (Yamagata Univ) |
(10)
IEICE-ICD |
15:25-15:50 |
A 65nm SOTB Based-On Code-Modulated Synchronized-OOK Transmitter for Normally-Off Wireless Sensor Networks |
Van-Trung Nguyen, Ryo Ishikawa, Koichiro Ishibashi (The UEC) |
| |
15:50-16:00 |
Break ( 10 min. ) |
Tue, Aug 7 PM
16:00 - 17:10 |
(11)
IEICE-ICD |
16:00-16:45 |
[Invited Talk]
A Battery Management System with a Low-Power State of Charge Monitoring Method and an Intermittently Enabled Coulomb Counter for IoT Devices |
Ken-ichi Kawasaki, Jun-ichi Nagata, Hiroyuki Nakamoto (Fujitsu Labs.) |
(12)
IEICE-ICD |
16:45-17:10 |
Power Consumption Estimation by Die Temperature for Processors Implemented on FPGA |
Hiroaki Kaneko, Akinori Kanasugi (Tokyo Denki Univ.) |
Wed, Aug 8 AM
09:00 - 10:10 |
(13)
IEICE-SDM |
09:00-09:45 |
[Invited Talk]
Research trends of resistance change devices using oxide materials
-- Application to non-volatile memory and neuromorphic device -- |
Hisashi Shima, Makoto Takahashi, Yasuhisa Naitoh, Hiroyuki Akinaga (AIST) |
(14)
IEICE-SDM |
09:45-10:10 |
Understanding Temperature Effect on Subthreshold Slope Variability in Bulk and SOTB MOSFETs |
Shuang Gao, Tomoko Mizutani, Kiyoshi Takeuchi, Masaharu Kobayashi, Toshiro Hiramoto (Univ. Tokyo) |
| |
10:10-10:20 |
Break ( 10 min. ) |
Wed, Aug 8 AM
10:20 - 11:50 |
(15)
IEICE-SDM |
10:20-11:05 |
[Invited Talk]
Neuromorphic Operation using an Atom/Ion Movement-Type Device |
Takeo Ohno (Oita Univ.) |
(16)
IST |
11:05-11:50 |
[Invited Talk]
Extremely low power device using crystalline oxide semiconductor |
Kiyoshi Kato (SEL) |
| |
11:50-12:50 |
Lunch Break ( 60 min. ) |
Wed, Aug 8 PM
12:50 - 14:25 |
(17)
IEICE-ICD |
12:50-13:15 |
Measurements and Analysis of Power Supply Noise in Digital IC Chip |
Kosuke Jike, Akihiro Tsukioka, Ryohei Sawada, Koh Watanabe, Noriyuki Miura, Makoto Nagata (Kobe Univ) |
(18)
IEICE-ICD |
13:15-13:40 |
Highly Symmetrical 10T 2-Read/Write Dual-port SRAM Bitcell Design In 28nm High-k/Metal-gate Planar Bulk CMOS Technology |
Yuichiro Ishii, Miki Tanaka, Makoto Yabuuchi, Yohei Sawada, Shinji Tanaka, Koji Nii (Renesas), Tien Yu Lu, Chun Hsien Huang, Shou Sian Chen, Yu Tse Kuo, Ching Cheng Lung, Osbert Cheng (UMC) |
(19)
IEICE-ICD |
13:40-14:25 |
[Invited Talk]
CMOS Annealing Machine for Combinatorial Optimization Problems |
Masanao Yamaoka (Hitachi) |
| |
14:25-14:35 |
Break ( 10 min. ) |
Wed, Aug 8 PM
14:35 - 17:40 |
(20)
IEICE-SDM |
14:35-15:00 |
Proposal of reconfigurable system LSI with BiCS technology |
Shigeyoshi Watanabe (Shonan Insti. of Tech.) |
(21)
IEICE-SDM |
15:00-15:25 |
Study of new stacked type logic circuit scheme with fabrication technology of 3D NAND flash memory.
-- Comparison with conventional LUT system and planar type -- |
Fumiya Suzuki, Sigeyoshi Watanabe (Shonan Inst. of Tech.) |
| |
15:25-15:40 |
Break ( 15 min. ) |
| (22) |
15:40-17:40 |
|
Thu, Aug 9 AM
09:30 - 11:45 |
(23)
IEICE-ICD |
09:30-10:15 |
[Invited Talk]
Flexible sensing system and venture startup |
Shusuke Yoshimoto (PGV Inc.) |
(24)
IEICE-ICD |
10:15-11:00 |
[Invited Talk]
Non-Contact Unobtrusive Sensing of Multiple Vital Signals Using Capacitive Coupling
-- Introduction of Cutting-Edge Researches -- |
Akinori Ueno (Tokyo Denki Univ.) |
(25)
IEICE-ICD |
11:00-11:45 |
[Invited Talk]
Wearable Monitoring Systems for Heart Rate Variability Analysis |
Shintaro Izumi (Osaka Univ.) |
| |
11:45-12:45 |
Lunch Break ( 60 min. ) |
Thu, Aug 9 PM
12:45 - 13:35 |
(26)
IEICE-ICD |
12:45-13:10 |
Study of Impact of BTI's Local Layout Effect Including Recovery Effect on Various Standard-Cells in 10nm FinFET |
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii (Renesas) |
(27)
IEICE-ICD |
13:10-13:35 |
12-nm Fin-FET 3.0G-search/s 80-bit x 128-entry Dual-port Ternary CAM |
Makoto Yabuuchi, Masao Morimoto, Koji Nii, Shinji Tanaka (Renesas) |
| |
13:35-13:45 |
Break ( 10 min. ) |
Thu, Aug 9 PM
13:45 - 15:20 |
(28)
IEICE-SDM |
13:45-14:10 |
Effect of multiple stress application in post-fabrication cell stability self-improvement in SRAM cell array |
Tomoko Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto (Univ. of Tokyo) |
(29)
IEICE-SDM |
14:10-14:35 |
Device and Process Design for HfO2-Based Ferroelectric Tunnel Junction Memory with Large Tunneling Electroresistance Effect and Multi-level Cell |
Masaharu Kobayashi, Yusaku Tagawa, Mo Fei, Toshiro Hiramoto (Univ. Tokyo) |
(30)
IEICE-SDM |
14:35-15:20 |
[Invited Talk]
Cu Atom Switch Technology toward 28nm Nonvolatile Programmable Logic |
Ryusuke Nebashi, Naoki Banno, Makoto Miyamura, Ayuka Morioka, Bai Xu, Koichiro Okamoto, Noriyuki Iguchi, Hideaki Numata, Hiromitsu Hada, Tadahiko Sugibayashi, Toshitsugu Sakamoto, Munehiro Tada (NEC) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Invited Talk | Each speech will have 40 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| IEICE-ICD |
Technical Committee on Integrated Circuits and Devices (IEICE-ICD) [Latest Schedule]
|
| Contact Address |
Masatoshi Tsuge (Socionext Inc.)
E- :  ge       cio xt
Takashi Hashimoto (Panasonic Corp.)
E-:    1967 pa  c |
| IST |
Technical Group on Information Sensing Technologies (IST) [Latest Schedule]
|
| Contact Address |
Masayuki Ikebe (Hokkaido Univ.)
E-: i beist   i |
| IEICE-SDM |
Technical Committee on Silicon Device and Materials (IEICE-SDM) [Latest Schedule]
|
| Contact Address |
Takahiro Mori （National Institute of Advanced Industrial Science and Technology）
E-:  -  aist
Tetsu Morooka （Toshiba Memory Corp.）
E-:   ba |
Last modified: 2018-06-22 11:39:02
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