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Technical Committee on Integrated Circuits and Devices (IEICE-ICD) [schedule] [select]
Chair Takeshi Yamamura (Fujitsu Labs.)
Vice Chair Minoru Fujishima (Hiroshima Univ.)
Secretary Osamu Watanabe (Toshiba)
Assistant Takeshi Yoshida (Hiroshima Univ.), Makoto Takamiya (Univ. of Tokyo), Akira Tsuchiya (Kyoto Univ.), Pham Konkuha (Univ. of Electro-Comm.)

* (IST) [schedule] [select]

Conference Date Thu, Jul 3, 2014 10:00 - 17:00
Fri, Jul 4, 2014 09:00 - 16:55
Topics Analog circuit, Mixed signal, RF and sensor I/F. 
Conference Place First day:Urara Taisha Cultural Hall, Second day: New WelCity Izumo 
Address First day:Taishachokizukiminami Izumo, Shimane 699-0711 Japan,Second day: 2-15-1 Enyaariharacho Izumo, Shimane 693-0023 Japan
Transportation Guide First day:http://www.city.izumo.shimane.jp/www/contents/1310104798186/html/common/536c87a3023.html, Second day:http://www.nwci.jp/access
Contact
Person
+81-853-72-2500
Sponsors This conference is co-sponsored by the IEEE SSCS Japan Chapter and Kansai Chapter.

Thu, Jul 3 AM 
10:00 - 17:00
(1)
IEICE-ICD
10:00-10:25 Instantaneous Frequency Discriminator using Time-to-Digital Converter Akihito Hirai, Koji Tsutsumi, Eiji Taniguchi (Mitsubishi Electric)
(2)
IEICE-ICD
10:25-10:50 Design of 1mm-Pitch 80x80-Channel 322Hz-Frame-Rate Touch Sensor with Two-Step Dual-Mode Capacitance Scan Noriyuki Miura (Kobe Univ.), Shiro Dosho (Pana.), Daisuke Fujimoto, Takuya Kiriyama (Kobe Univ.), Hiroyuki Tezuka, Takuji Miki (Pana.), Makoto Nagata (Kobe Univ.)
(3)
IEICE-ICD
10:50-11:15 A 4-GS/s 5-bit Flash ADC with Dynamic pre-amplifier Junya Matsuno, Masanori Furuta, Tetsuro Itakura (Toshiba)
(4)
IEICE-ICD
11:15-12:05 [Invited Talk]
Extremely Low Power and Low Voltage Sucessive Approximation Register ADC
Hiroki Ishikuro (Keio Univ.)
  12:05-13:30 Lunch Break ( 85 min. )
(5)
IEICE-ICD
13:30-13:55 Analysis of ultra-fast image sensor with Monte Carlo device simulation technique Yoshinari Kamakura (Osaka Univ.), Kazuhiro Shimonomura, Takeharu G. Etoh (Ritsumeikan Univ.)
(6)
IST
13:55-14:45 [Invited Talk]
Characterization of Individual Oxide Traps Contributing to Multi-Trap Random Telegraph Noise in Nano-Scaled MOSFETs
Toshiaki Tsuchiya (Shimane Univ.)
(7)
IST
14:45-15:35 [Invited Talk]
High-performance or functional multi-aperture image sensors, cameras, and their applications
Keiichiro Kagawa, Shoji Kawahito (Shizuoka Univ.)
  15:35-15:50 Break ( 15 min. )
(8) 15:50-17:00  
Fri, Jul 4 AM 
09:00 - 16:55
(9)
IST
09:00-09:50 [Invited Talk]
High Speed and High Sensitivity CMOS Image Sensor Technologies for Ultimate Imaging Performances
Rihito Kuroda, Shigetoshi Sugawa (Tohoku Univ.)
(10)
IST
09:50-10:40 [Invited Talk]
Quantum Imaging with SOI Technology
Yasuo Arai (KEK)
  10:40-10:50 Break ( 10 min. )
(11)
IST
10:50-11:15 Study on a Single Slope ADC with intermittent TDC Makito Someya, Daisuke Uchida, Masayuki Ikebe, Junichi Motohisa, Eiichi Sano (Hokkaido Univ.)
(12)
IST
11:15-11:40 Fabrication and measurement of 2.4 GHz pre-bias rectifier Tomohide Yoshikawa, Kazuki Hiraishi, Toshiki Wada, Masayuki Ikebe, Eichi Sano (Hokkaido Univ.)
(13)
IST
11:40-12:05 A Dickson Charge Pump Circuit with Automatic threshold voltage control Xie Kan, Masayuki Ikebe, Junichi Motohisa, Eiichi Sano (Hokkaido Univ.)
  12:05-13:25 Lunch Break ( 80 min. )
(14)
IEICE-ICD
13:25-14:15 [Invited Talk]
A study of enhancement of Q-factor of LC Resonators in high frequency region
Nobuyuki Itoh, Yuka Itano, Hiroki Tsuji, Kiyotaka Komoku, Takayuki Morishita (Okayama Prefec. Univ.), Sadayuki Yoshitomi (Toshiba Corp.)
(15)
IEICE-ICD
14:15-14:40 RF power amplifier for application to Ocean Monitering System Jang-Hyeon Jeong, Ki-Jun Son, Jeong-Hoon Kim, Young Yun (KMOU)
(16)
IEICE-ICD
14:40-15:05 A transmission line with a high quality factor employing periodic structure on silicon substrate for application to RF integrated circuit Ki-Jun Son, Jang-Hyeon Jeong, Jung-Hoon Kim, Young Yun (KMOU)
(17)
IEICE-ICD
15:05-15:30 Study on Flexible RF circuits for application to rollable and foldable mobile communication devices Jeong-hoon Kim, Jang-Hyeon Jeong, Ki-Jun Son, Young Yun (KMOU)
  15:30-15:40 Break ( 10 min. )
(18)
IEICE-ICD
15:40-16:05 92% Start-up Time Reduction by Chirp Injection and Negative Resistance Booster in 39MHz Crystal Oscillator Shunta Iguchi, Hiroshi Fuketa, Takayasu Sakurai, Makoto Takamiya (Univ. of Tokyo)
(19)
IEICE-ICD
16:05-16:30 Low-Voltage-Operation Capacitance Detection Circuit for On-Chip Microparticle Manipulation Rie Yamane, Hirosuke Iwasaki, Yoshiaki Dei, Ji Cui, Toshimasa Matsuoka (Osaka Univ.)
(20)
IEICE-ICD
16:30-16:55 Judging Method of Same Circuit Topology Takayuki Negishi, Masato Kato, Hiroaki Seki, Yoshiki Sugawara, Kento Suzuki, Nobukazu Takai, Haruo Kobayashi (Gunma Univ.)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.
Invited TalkEach speech will have 45 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
IEICE-ICD Technical Committee on Integrated Circuits and Devices (IEICE-ICD)   [Latest Schedule]
Contact Address Takeshi Yoshida (Hiroshima University)
TEL 082-424-7643,FAX 082-424-7643
E--mail:tdsl-u 
IST * (IST)   [Latest Schedule]
Contact Address  


Last modified: 2014-05-29 18:00:23


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