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All Technical Committee Conferences  (Searched in: Recent 10 Years)


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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
IST, ME, IEICE-IE, IEICE-BioX, IEICE-SIP, IEICE-MI [detail] 2025-06-05
10:50
Ishikawa   Study on Skateboarding Training Support Using Image Analysis
Taigo Kikuchi, Hiroyuki Arai (NIT)
In this paper, we propose a method to support the improvement of skateboarding using image analysis technology. We defin... [more] IST2025-22 ME2025-60
pp.1-6
AIT, IIEEJ, AS, CG-ARTS 2024-03-05
10:55
Tokyo Tokyo University of Technology Development of a serious game to improve mutual aid in times of disaster
Ayato Yamada, Junko Sugimori, Toshiya Arakawa (NIT)
 [more] AIT2024-63
pp.109-112
IEICE-LOIS, IEICE-EMM, IEICE-IE, IEE-CMN, ME, IPSJ-AVM [detail] 2020-09-01
13:10
Online Online Estimation of vibration component in outdoor image captured by in-vehicle line sensor
Hiroyuki Arai (NIT), Kaori Kataoka, Takayuki Umeda, Shingo Ando (NTT)
A method for estimating and correcting the vibration component in outdoor image captured by vertically installed in-vehi... [more] ME2020-85
pp.1-6
BCT, IEEE-BT [detail] 2019-07-25
16:30
Hokkaido Tokachi-Plaza [Special Talk] Challenge of 3D drone mesh network and formation flight considering interference signals
Takefumi Hiraguri (NIT)
 [more] BCT2019-65
pp.29-34
ME 2019-07-16
15:00
Tokyo   Image Recognition of Braille Blocks to Support Pedestrians with Visual Impairment -- Periodic Dot Pattern Detection using Fourier Analysis --
Mitsuharu Ueno, Hiroyuki Arai (NIT)
 [more] ME2019-89
pp.27-30
ME 2019-07-16
15:30
Tokyo   Image Recognition of Braille blocks by Analysis of Autocorrelation Pattern
Hiroyuki Arai, Mitsuharu Ueno (NIT)
 [more] ME2019-90
pp.31-34
ME, CE, IPSJ-AVM, IEICE-IE [detail] 2016-08-08
15:40
Fukuoka   Proposal of Extraction Method of Sealant Region using Color Pattern Illumination and YCbCr Color Space
Shingo Aramaki, Shota Nakashima, Kanya Tanaka (Yamaguchi Univ.), Atsushi Sanada (NIT)
In recent years, automation inspection systems using image processing are developed in appearance inspection of producti... [more]
 Results 1 - 7 of 7  /   
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