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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
IST 2015-03-27
09:00
Tokyo Kikai-Shinko-Kaikan Bldg. A 1/1.7-inch 20Mpixel Back-illuminated Stacked CMOS Image Sensor for New Imaging Applications
Toshiki Kainuma, Atsushi Suzuki, Nobutaka Shimamura, Naoki Kawazu, Chihiro Okada, Takumi Oka (Sony), Kensuke Koiso (Sony Semiconductor), Atsushi Masagaki, Yoichi Yagasaki (Sony), Shigeru Gonoi (Sony LSI Design), Tatsuya Ichikawa, Tohru Ueda (Sony), Masatoshi Mizuno (Sony LSI Design), Tatsuya Sugioka, Takafumi Morikawa (Sony)
We have developed a 1/1.7-inch 20Mpixel back-illuminated stacked CMOS image sensor with parallel multiple sampling, two ... [more] IST2015-10
pp.1-4
IST 2014-03-14
11:30
Tokyo NHK 3D Stacked CMOS Image Sensor
Taku Umebayashi, Tomoharu Ogita, Shunichi Sukegawa, Tsutomu Nakajima, Hiroshi Kawanobe (Sony), Ken Koseki (Sony LSI Design), Tsutomu Haruta, Hiroshi Takahashi (Sony), Keishi Inoue (Sony Semiconductor), Toshifumi Wakano, Yusuke Mada, Koji Fukumoto, Takashi Nagano, Yoshikazu Nitta, Teruo Hirayama (Sony)
We have developed 3D stacked CMOS image sensor. This technology is a Back-illuminated CIS stacking on a logic substrate.... [more] IST2014-9
p.5
IST 2014-03-14
12:00
Tokyo NHK Three-dimensional Structures for High Saturation Signals and Crosstalk Suppression in 1.20 um Pixel Back-Illuminated CMOS Image Sensor
Takekazu Shinohara, Kazufumi Watanabe (Sony Semiconductor), Takashi Abe, Kazunobu Ohta (Sony), Hajime Nakayama (Sony Semiconductor), Takafumi Morikawa, Keiichi Ohno (Sony), Dai Sugimoto (Sony Semiconductor), Shingo Kadomura, Teruo Hirayama (Sony)
We propose two technologies, vertical transfer gate (VTG) and buried shielding metal (BSM), that can be applied to 1.20 ... [more] IST2014-10
pp.7-10
IST, CE 2012-03-30 Tokyo Kikai-Shinko-Kaikan Bldg. A Global-Shutter CMOS Image Sensor with In-Pixel Dual Storage
Masaki Sakakibara, Yusuke Oike, Takafumi Takatsuka, Akihiko Kato, Katsumi Honda, Tadayuki Taura, Takashi Machida (Sony), Jun Okuno, Atsuhiro Ando, Taketo Fukuro, Tomohiko Asatsuma, Suzunori Endo, Junpei Yamamoto, Yasuhiro Nakano, Takumi Kaneshige (SONY Semiconductor)
In this paper, we report a Global-Shutter CMOS Image Sensor with no picture distortion which caused due to line-scanned ... [more]
 Results 1 - 4 of 4  /   
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