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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
IST 2024-03-27
15:30
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
A 3.36 µm-pitch SPAD photon-counting image sensor using clustered multi-cycle clocked recharging technique with intermediate most-significant-bit readout
Takafumi Takatsuka, Jun Ogi, Yasuji Ikeda, Kazuki Hizu, Yutaka Inaoka, Shunsuke Sakama, Iori Watanabe, Tatsuya Ishikawa, Shohei Shimada, Junki Suzuki (SSS), Hidenori Maeda, Kenji Toshima (SCK), Yusuke Nonaka, Akifumi Yamamura, Hideki Ozawa, Fumihiko Koga, Yusuke Oike (SSS)
This paper introduces the pixel front-end (PFE) circuit pitch reduction of SPAD photon count image sensor, which was rep... [more] IST2024-21
pp.42-45
IST 2020-03-27
09:50
Tokyo Kikaishinko kaikan
(Postponed)
A 1280 x 720 Back-Illuminated Stacked Temporal Contrast Event-based Vision Sensor with 4.86μm Pixels, 1.066GEPS Readout, Programmable Event Rate Controller and Compressive Data Formatting Pipeline
Thomas Finateu (Prophesee), Atsumi Niwa (Sony), Daniel Matolin (Prophesee), Koya Tsuchimoto (Sony), Andrea Mascheroni, Etienne Reynaud (Prophesee), Pooria Mostafalu, Frederick Brady (Sony), Ludovic Chotard, Florian LeGoff (Prophesee), Hirotsugu Takahashi, Hayato Wakabayashi, Yusuke Oike (Sony), Christoph Posch (Prophesee)
Event-based vision and image sensors, due to large circuitry in each pixel, benefit from wafer-stacking to achieve compe... [more] IST2020-10
pp.13-16
IST 2020-03-27
17:40
Tokyo Kikaishinko kaikan
(Postponed)
A 132dB single-exposure dynamic range, CMOS image sensor with high-temperature tolerance
Takahiro Toya, Yorito Sakano, Takahiro Toyoshima, Ryosuke Nakamura, Tomohiko Asatsuma, Yuki Hattori (SSS), Takayuki Yamanaka, Ryoichi Yoshikawa (SCK), Naoki Kawazu, Tomohiro Matsuura, Takahiro Iinuma, Tomohiko Watanabe, Atsushi Suzuki, Yuichi Motohashi, Junichiro Azami, Yasushi Tateshita, Tsutomu Haruta (SSS)
 [more] IST2020-26
pp.85-88
IDY, SID-JC 2019-03-07
13:05
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] 4032ppi High-Resolution OLED Microdisplay
Takuma Fujii, Chiaki Kon, Yosuke Motoyama, Kan Simizu, Tsutomu Shimayama (Sony Semicoductor Solutions), Takashi Yamazaki, Takayoshi Kato (Sony), Seigou Sakai, Koichi Hashikaki (Sony LSI Design), Koji Tanaka, Yasuhiro Nakano (Sony Semiconductor Manufacturing)
 [more] IDY2019-23
pp.1-5
IST 2018-03-09
12:00
Tokyo NHK Housou-Gijyutu Lab. [Invited Talk] Pixel/DRAM/logic 3-layer stacked CMOS image sensor technology
Hidenobu Tsugawa, Hiroshi Takahashi, Ryoichi Nakamura, Taku Umebayashi, Tomoharu Ogita, Hitoshi Okano, Kazuya Iwase, Hiroyuki Kawashima, Takatsugu Yamasaki, Daisuke Yoneyama, Jun Hashizume, Tsutomu Nakajima, Kenichi Murata, Yoshikazu Kanaishi, Kenji Ikeda, Keiji Tatani, Hajime Nakayama, Tsutomu Haruta, Tetsuo Nomoto (Sony)
 [more] IST2018-17
pp.25-29
IST 2017-03-10
14:35
Tokyo NHK Research Lab. Auditorium (Setagaya) Four-Directional Pixel-Wise Polarization CMOS Image Sensor Using Air-Gap Wire Grid on 2.5-μm Back-Illuminated Pixels
Yusuke Uesaka (Sony Semiconductor Solutions Corporation), Tomohiro Yamazaki (Sony Semiconductor Manufacturing Corporation), Yasushi Maruyama, Motoaki Nakamura, Yoshihisa Matoba (Sony Semiconductor Solutions Corporation), Takashi Terada, Kenta Komori, Yoshiyuki Ohba, Shinichi Arakawa (Sony Semiconductor Manufacturing Corporation), Yasutaka Hirasawa, Yuhi Kondo, Jun Murayama (Sony), Kentaro Akiyama, Yusuke Oike, Shuzo Sato (Sony Semiconductor Solutions Corporation)
 [more] IST2017-16
pp.31-34
IST 2016-09-26
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. An 8.3M-pixel 480fps Global-Shutter CMOS Image Sensor with Gain-Adaptive Column ADCs and 2-on-1 Stacked Device
Yuri Kato, Yusuke Oike, Kentaro Akiyama, Luong D. Hung, Wataru Niitsuma, Akihiko Kato, Mamoru Sato, Wataru Nakamura, Hiroshi Shiroshita, Yorito Sakano, Yoshiaki Kitano, Takuya Nakamura, Takayuki Toyama, Hayato Iwamoto, Takayuki Ezaki (Sony)
A 4K2K 480 fps global-shutter CMOS image sensor has been developed with super 35 mm format.
This sensor employs newly d... [more]
IST2016-43
pp.7-10
IEICE-ICD, IEICE-SDM, IST [detail] 2016-08-01
09:15
Osaka Central Electric Club [Invited Talk] Accelerating the Sensing World through Imaging Evolution
Yusuke Oike, Hayato Wakabayashi, Tetuo Nomoto (Sony Semiconductor Solutions)
 [more]
 Results 1 - 8 of 8  /   
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