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Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IST, IEICE-ICD |
2013-07-05 14:30 |
Hokkaido |
Sun ref re Hakodate |
A 1.0-V 12-bit Digitally Calibrated SAR ADC Using Hybrid DAC Technique Furuta Masanori, Hirotomo Ishii, Tomohiko Sugimoto, Toru Okawa, Masazumi Shiochi, Tetsuro Itakura (Toshiba Corp.) |
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IST, IEICE-ICD |
2011-07-22 10:25 |
Hiroshima |
Hiroshima Institute of Technology |
Analysis Methods of Substrate Sensitivity in an Analog Circiut Satoshi Takaya, Yoji Bando (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) |
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IST, IEICE-ICD |
2010-07-22 10:20 |
Osaka |
Josho Gakuen Osaka Center |
In-situ Evaluation of Vth and AC Gain of 90 nm CMOS Differential Pair Transistors Yoji Bando, Satoshi Takaya, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) |
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