| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2023-08-01
10:45 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
A research on a cryogenic ADC for acquisition of environmental noise near quantum devices.
Tomoya Yamada, Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] |
|
| IEICE-ICD, IEICE-SDM, IST [detail] |
2023-08-01
11:10 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
Evaluation on Flip-Chip Packaging for Quantum Computers at Cryogenic Temperature
Misato Taguchi, Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] |
|
| IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-08
15:05 |
Online |
On-line |
Evaluation of Backside Voltage Disturbance Impacts and IC Chip Response in Flip Chip Packaging
Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa (Kobe Univ.), Kikuo Muramatsu (e-SYNC), Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo (Megachips), Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] |
|
| IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-08
15:55 |
Online |
On-line |
A cryogenic digital-to-analog converter for high-fidelity control of large-scale qubit arrays
Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] |
|
| IEICE-SDM, IEICE-ICD, IST [detail] |
2021-08-18
15:35 |
Online |
Online |
On-chip multi-channel noise sensor circuits to detect off-chip security attacks
Ryozo Takahashi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] |
|
| IEICE-ICD, IEICE-SDM, IST [detail] |
2020-08-06
13:50 |
Online |
Online |
Over-the-top Si Interposer Embedding Backside Buried Metal to Reduce Power Supply Impedance
Takuji Miki, Makoto Nagata, Akihiro Tsukioka (Kobe Univ.), Noriyuki Miura (Osaka Univ.), Takaaki Okidono (ECSEC), Yuuki Araga, Naoya Watanabe, Haruo Shimamoto, Katsuya Kikuchi (AIST) |
[more] |
|
| IEICE-SDM, IEICE-ICD, IST [detail] |
2019-08-09
12:00 |
Hokkaido |
Hokkaido Univ., Graduate School /Faculty of Information Science and |
Evaluation of generation and reduction technology of unnecessary radio waves by digital IC chip
Kosuke Jike, Koh Watanabe, Noriyuki Miura, Makoto Nagata (Kobe Univ) |
[more] |
|
| IST, IEICE-ICD, IEICE-SDM |
2018-08-08
12:50 |
Hokkaido |
Hokkaido University M Bldg. M151 |
Measurements and Analysis of Power Supply Noise in Digital IC Chip
Kosuke Jike, Akihiro Tsukioka, Ryohei Sawada, Koh Watanabe, Noriyuki Miura, Makoto Nagata (Kobe Univ) |
[more] |
|
| IST, IEICE-ICD |
2014-07-03
10:25 |
Shimane |
|
Design of 1mm-Pitch 80x80-Channel 322Hz-Frame-Rate Touch Sensor with Two-Step Dual-Mode Capacitance Scan
Noriyuki Miura (Kobe Univ.), Shiro Dosho (Pana.), Daisuke Fujimoto, Takuya Kiriyama (Kobe Univ.), Hiroyuki Tezuka, Takuji Miki (Pana.), Makoto Nagata (Kobe Univ.) |
A 1mm-pitch 80x80-channel 322Hz-frame-rate capacitive touch sensor has been developed. Multiple touch points are detecte... [more] |
|
| IST, IEICE-ICD |
2013-07-05
17:20 |
Hokkaido |
Sun ref re Hakodate |
Equivalent circuit representation of silicon substrate coupling of active RF components
Naoya Azuma, Makoto Nagata (Kobe univ.) |
[more] |
|
| IEICE-EMCJ, BCT |
2013-03-08
15:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Proposal of a New In-Band Spurious Suppression Technique usable for LTE-Class RFIC
-- Magnetic Thin Film Integration by Back-End-of-Line Process --
Sho Muroga, Yasushi Endo, Tetsuo Ito, Satoshi Tanaka (Tohoku Univ.), Motoki Murakami, Kazuaki Hori (Renesas Electronics), Satoru Takahashi (Renesas Mobile), Naoya Azuma, Makoto Nagata (Kobe Univ.), Masahiro Yamaguchi (Tohoku Univ.) |
[more] |
|
| IST, IEICE-ICD |
2011-07-22
10:25 |
Hiroshima |
Hiroshima Institute of Technology |
Analysis Methods of Substrate Sensitivity in an Analog Circiut
Satoshi Takaya, Yoji Bando (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) |
[more] |
|
| IST, IEICE-ICD |
2011-07-22
10:50 |
Hiroshima |
Hiroshima Institute of Technology |
A Diagnosis Testbench of Analog IP Cores Against On-Chip Environmental Disturbances
Yuuki Araga, Takushi Hashida, Shinichiro Ueyama, Makoto Nagata (Kobe Univ.) |
[more] |
|
| IST, IEICE-ICD |
2011-07-22
11:15 |
Hiroshima |
Hiroshima Institute of Technology |
[Invited Talk]
Noise Reduction Technology for RFIC receiver of LTE-Class Cell Phone Handset
-- From the View Point of Magnetic Near Field Measurement and Countermeasure --
Masahiro Yamaguchi, Yasushi Endo (Tohoku Univ.), Makoto Nagata (Kobe Univ.) |
[more] |
|
| IST, IEICE-ICD |
2010-07-22
09:30 |
Osaka |
Josho Gakuen Osaka Center |
On-Chip Waveform Capture and Diagnosis of Power Delivery in SoC Integration
Takushi Hashida, Hiroshi Matsumoto, Makoto Nagata (Kobe Univ.) |
[more] |
|
| IST, IEICE-ICD |
2010-07-22
09:55 |
Osaka |
Josho Gakuen Osaka Center |
The Minimal Structure of On-Chip Monitoring and Application to Evaluation of Chip Environments
Yuuki Araga, Takushi Hashida, Makoto Nagata (Kobe Univ.) |
[more] |
|
| IST, IEICE-ICD |
2010-07-22
10:20 |
Osaka |
Josho Gakuen Osaka Center |
In-situ Evaluation of Vth and AC Gain of 90 nm CMOS Differential Pair Transistors
Yoji Bando, Satoshi Takaya, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) |
[more] |
|
|