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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2024-03-27
14:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
Cross Dual-Pixel Twisted-Photodiode Image Sensor for All-Directional Auto Focus
Daiki Shirahige, Koichi Fukuda, Hajime Ikeda, Yusuke Onuki, Ginjiro Toyoguchi, Hiroshi Sekine, Shuhei Hayashi, Kohei Okamoto, Shunichi Wakashima, Ryo Yoshida, Junji Iwata, Yasushi Matsuno, Katsuhito Sakurai, Hiroshi Yuzurihara, Takeshi Ichikawa (Canon) |
[more] |
IST2024-18
pp.29-33 |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2023-08-01
15:25 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
[Invited Talk]
Low-Frequency Noise Source in Cryogenic Operation of Short-Channel Bulk MOSFETs
Takumi Inaba, Hiroshi Oka, Hidehiro Asai, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Shunsuke Shitakata, Koichi Fukuda, Takahiro Mori (AIST) |
[more] |
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| IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-09
11:50 |
Online |
On-line |
TCAD Analysis for threshold voltage increase in cryogenic MOSFET operation
Hidehiro Asai, Takumi Inaba, Junichi Hattori, Koichi Fukuda, Hiroshi Oka, Takahiro Mori (AIST) |
[more] |
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| IST |
2021-10-21
13:20 |
Online |
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A Compressed N×N Multi-Pixel Imaging and Cross Phase-Detection AF with N×1RGrB+1×NGb Hetero Multi-Pixel Image Sensors
Koichi Fukuda (CANON INC., Tohoku Univ.) |
[more] |
IST2021-55
pp.29-32 |
| IEICE-SDM, IEICE-ICD, IST [detail] |
2021-08-17
10:15 |
Online |
Online |
[Invited Talk]
Buried nanomagnet realizing high-speed/low-variability silicon spin qubits: implementable in error-correctable large-scale quantum computers
Shota Iizuka, Kimihiko Kato, Atsushi Yagishita, Hidehiro Asai, Tetsuya Ueda, Hiroshi Oka, Junichi Hattori, Tsutomu Ikegami, Koichi Fukuda, Takahiro Mori (AIST) |
[more] |
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| IEICE-SDM, IEICE-ICD, IST [detail] |
2019-08-07
14:15 |
Hokkaido |
Hokkaido Univ., Graduate School /Faculty of Information Science and |
TCAD analysis of the fringe-field effect on transfer characteristics of 2D channel FET
Hidehiro Asai, Wen Hsin Chang, Naoya Okada, Koich Fukuda, Toshifumi Irisawa (AIST) |
[more] |
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| IEICE-SDM, IEICE-ICD, IST [detail] |
2017-07-31
12:00 |
Hokkaido |
Hokkaido-Univ. Multimedia Education Bldg. |
TCAD Simulation of C-TFET Circuit with Drain Offset Structure
Hidehiro Asai, Takahiro Mori, Junich Hattori, Takashi Matsukawa, Koichi Fukuda (AIST) |
[more] |
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