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Committee Date Time Place Paper Title / Authors Abstract Paper #
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
14:00
Online On-line Evaluation of Steep Subthreshold Slope Device "Dual-gate PN-body Tied SOI-FET" for Ultra-low Voltage Operation
Haruki Yonezaki, Jiro Ida, Takayuki Mori (KIT), Koichiro Ishibashi (UEC)
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