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Committee Date Time Place Paper Title / Authors Abstract Paper #
IST 2013-09-30
Tokyo Kikai-Shinko-Kaikan Bldg. New model of Dark fixed pattern noise generation in CMOS imager pixel with negative transfer-gate bias operation
Hiroki Sasaki, Yusuke Higashi, Hirofumi Yamashita, Takeshi Yoshida, Nobuyuki Momo, Tatsuya Ohguro, Hisayo Momose, Yoshiaki Toyoshima (Toshiba)
 [more] IST2013-42
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