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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
IST 2016-11-17
16:30
Tokyo TITECH Tamachi Campus [Poster Presentation] [Poster Presentation] SOI based high energy particle imaging with continuous time integration variable gain pixel
Sumeet Shrestha, Hiroki Kamehama, Keita Yasutomi, Keiichiro Kagawa, Nobukazu Teranishi (Shizuoka University), Aayaki Takeda, Takeshi Go Tsuru, Yasuo Arai (Kyoto University), Shoji Kawahito (Shizuoka University)
 [more] IST2016-54
pp.13-14
IST 2015-09-18
14:30
Tokyo Kikai-Shinko-Kaikan Bldg. The performance evaluation of fully depleted SOI pixel detector with backgate surface potential pinning
Hiroki Kamehama, Sumeet Shrestha, Keita Yasutomi, Keiichiro Kagawa (Shizuoka Univ.), Ayaki Takeda, Takeshi Go Tsuru (Kyoto Univ.), Yasuo Arai (KEK), Shoji Kawahito (Shizuoka Univ.)
 [more] IST2015-52
pp.37-40
IST 2015-05-08
13:10
Tokyo   [Poster Presentation] Design and Evaluation of lock-in image sensors using full-depleted SOI pixels
Ryo Hasegawa, Keita Yasutomi, Sumeet Shrestha, Yoon Hyungjune, Nobukazu Teranishi, Hiroki Kamehama, Keiichiro Kagawa, Shoji Kawahito (Shizuoka Univ)
This paper proposes a lock-in pixel using a fully-depleted SOI pixel structure, which has high sensitivity for near-infr... [more] IST2015-26
pp.9-12
IST 2014-12-01
16:30
Tokyo Tamachi Campus, Tokyo Institute of Technology [Poster Presentation] Fully Depleted SOI Pixel Photo Detectors With Surface Potential Pinning
Hiroki Kamehama, Sumeet Shrestha, Keita Yasutomi, Keiichiro Kagawa (Shizuoka University), Ayaki Takeda, Takeshi Go Tsuru (Kyoto Univ.), Yasuo Arai (KEK), Shoji Kawahito (Shizuoka University)
 [more] IST2014-81
pp.57-58
IST 2014-03-14
17:10
Tokyo NHK The SOI PIxel Image Sensors and Their Scientific Applications
Shoji Kawahito, Hiroki Kamehama, Sumeet Shrestha, Keita yasutomi, Keiichiro Kagawa (Shizuoka Univ.), Masayuki Ikebe (Hokkaido Univ.), Yasuo Arai (KEK)
 [more] IST2014-17
pp.35-37
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