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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
IST 2018-03-09
11:00
Tokyo NHK Housou-Gijyutu Lab. A Back-Illuminated Global-Shutter CMOS Image Sensor with Pixel-Parallel 14b Subthreshold ADC
Koji Ogawa, Masaki Sakakibara, Shin Sakai, Yasuhisa Tochigi, Katsumi Honda, Hidekazu Kikuchi, Takuya Wada, Yasunobu Kamikubo, Tsukasa Miura, Masahiko Nakamizo (Sony Semiconductor Solutions), Naoki Jyo, Ryo Hayashibara (Sony Semiconductor Manufacturing), Yohei Furukawa, Shinya Miyata (Sony LSI Design), Satoshi Yamamoto, Yoshiyuki Ota, Hirotsugu Takahashi, Tadayuki Taura, Yusuke Oike, Keiji Tatani, Takayuki Ezaki, Teruo Hirayama (Sony Semiconductor Solutions)
 [more] IST2018-14
pp.13-16
IST 2017-09-25
16:25
Tokyo Kikai-Shinko-Kaikan Bldg. A 224 ke Linear Saturation Signal Global Shutter CMOS Image Sensor with 3.875um pixel, in-pixel Pinned Storage, and Lateral Overflow Integration Capacitor
Shin Sakai, Yorito Sakano, Yoshiaki Tashiro, Yuri Kato, Kentaro Akiyama, Katsumi Honda, Mamoru Sato, Masakai Sakakibara, Tadayuki Taura, Kenji Azami, Tomoyuki Hirano, Yusuke Oike, Yasunori Sogo, Takayuki Ezaki, Tadakuni Narabu, Teruo Hirayama (SSS), Shigetoshi Sugawa (Tohoku Univ.)
 [more] IST2017-59
pp.43-46
IST, CE 2012-03-30 Tokyo Kikai-Shinko-Kaikan Bldg. A Global-Shutter CMOS Image Sensor with In-Pixel Dual Storage
Masaki Sakakibara, Yusuke Oike, Takafumi Takatsuka, Akihiko Kato, Katsumi Honda, Tadayuki Taura, Takashi Machida (Sony), Jun Okuno, Atsuhiro Ando, Taketo Fukuro, Tomohiko Asatsuma, Suzunori Endo, Junpei Yamamoto, Yasuhiro Nakano, Takumi Kaneshige (SONY Semiconductor)
In this paper, we report a Global-Shutter CMOS Image Sensor with no picture distortion which caused due to line-scanned ... [more]
 Results 1 - 3 of 3  /   
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