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BCT
,
SHIKOKU
,
IEEE-BT
2011-10-21
10:55
Ehime
Ehime Univ.
Considerations on Measurement Errors caused by Delay time fraction at Delay Profiles
Kazuhisa Haeiwa
(
Hiroshima City Univ.
),
Kazuhiko Kitayama
(
NHK Itech
),
Takeshi kamio
,
Hisato Fujisaka
(
Hiroshima City Univ.
)
[more]
BCT2011-75
pp.41-44
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