ITE Technical Group Submission System
Conference Schedule |
Online Proceedings
[Sign in]
|
|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IST |
2020-03-27 13:00 |
Tokyo |
Kikaishinko kaikan (Postponed) |
[Invited Talk]
High-speed Image Processing Devices and Its Applications Masatoshi Ishikawa (Univ.Tokyo) |
High-speed image processing devices including stacked type CMOS imagers will be explained. In addition, their applicatio... [more] |
IST2020-15 pp.33-34 |
IST |
2019-03-22 13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A 32X32-Pixel 0.9THz Imager with Pixel-Parallel 12b VCO-Based ADC in 0.18μm CMOS Yuri Kanazawa, Sayuri Yokoyama, Takahiro Ikegami, Prasoon Ambalathankandy, Shota Hiramatsu, Eiichi Sano (Hokkaido Univ.), Yuma Takida, Hiroaki Minamide (RIKEN), Masayuki Ikebe (Hokkaido Univ.) |
A terahertz imaging has attracted attention. However, it is problem that conventional terahertz imagers are expensive. A... [more] |
IST2019-18 pp.33-36 |
IST, IEICE-ICD, IEICE-SDM |
2018-08-07 09:25 |
Hokkaido |
Hokkaido University M Bldg. M151 |
Wide-band CMOS terahertz imaging pixel Yuri Kanazawa, Shota HIramatsu, Eiichi Sano, Sayuri Yokoyama, Masayuki Ikebe (Hokkaido Univ) |
We propose a Si–CMOS terahertz image sensor to solve the paucity of low-cost detectors. Here the
imager chip consists o... [more] |
IST2018-44 pp.5-9 |
IST |
2018-03-09 13:50 |
Tokyo |
NHK Housou-Gijyutu Lab. |
An Experimental CMOS Photon Detector with 0.5e- RMS Temporal Noise and 15μm pitch Active Sensor Pixels Toshiyuki Nishihara, Matsuo Matsumura,, Tsutomu Imoto, Kenichi Okumura, Yorito Sakano, Yuhi Yorikado, Yoshiaki Tashiro, Hayato Wakabayashi, Yusuke Oike, Yoshikazu Nitta (Sony Semiconductor Solutions) |
This is the first reported non-electron-multiplying CMOS Image Sensor (CIS) photon-detector for replacing Photo Multipli... [more] |
IST2018-19 pp.35-38 |
|
|
|
[Return to Top Page]
[Return to ITE Web Page]
|