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Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IST |
2022-03-28 11:10 |
Online |
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Charge Transfer Analysis for Vertical Transfer Gates by 3D Device Simulation and Its Application for High-Speed Image Sensors Hideki Mutoh (Link Research) |
The analysis of charge transfer characteristics for CMOS image sensors with vertical transfer gates by 3D device simulat... [more] |
IST2022-14 pp.17-20 |
IST |
2014-03-14 12:00 |
Tokyo |
NHK |
Three-dimensional Structures for High Saturation Signals and Crosstalk Suppression in 1.20 um Pixel Back-Illuminated CMOS Image Sensor Takekazu Shinohara, Kazufumi Watanabe (Sony Semiconductor), Takashi Abe, Kazunobu Ohta (Sony), Hajime Nakayama (Sony Semiconductor), Takafumi Morikawa, Keiichi Ohno (Sony), Dai Sugimoto (Sony Semiconductor), Shingo Kadomura, Teruo Hirayama (Sony) |
We propose two technologies, vertical transfer gate (VTG) and buried shielding metal (BSM), that can be applied to 1.20 ... [more] |
IST2014-10 pp.7-10 |
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