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Technical Group on Information Sensing Technologies (IST) (Searched in: 2016)
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Search Results: Keywords 'from:2016-09-26 to:2016-09-26'
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Ascending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IST |
2016-09-26 13:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
[Invited Talk]
Accelerating the Sensing World through Imaging Evolution Satoshi Yoshihara, Tetsuo Nomoto, Yusuke Oike, Hayato Wakabayashi (Sony Semiconductor Solutions) |
[more] |
IST2016-42 pp.1-5 |
IST |
2016-09-26 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
An 8.3M-pixel 480fps Global-Shutter CMOS Image Sensor with Gain-Adaptive Column ADCs and 2-on-1 Stacked Device Yuri Kato, Yusuke Oike, Kentaro Akiyama, Luong D. Hung, Wataru Niitsuma, Akihiko Kato, Mamoru Sato, Wataru Nakamura, Hiroshi Shiroshita, Yorito Sakano, Yoshiaki Kitano, Takuya Nakamura, Takayuki Toyama, Hayato Iwamoto, Takayuki Ezaki (Sony) |
A 4K2K 480 fps global-shutter CMOS image sensor has been developed with super 35 mm format.
This sensor employs newly d... [more] |
IST2016-43 pp.7-10 |
IST |
2016-09-26 14:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
A dead-time free global shutter stacked CMOS image sensor with in-pixel lateral overflow integration capacitor and ADC using pixel-wise direct connections Rihito Kuroda, Hidetake Sugo, Shunichi Wakashima, Shigetoshi Sugawa (Tohoku Univ.) |
[more] |
IST2016-44 pp.11-14 |
IST |
2016-09-26 15:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
RTS and photon shot noise reduction based on maximum likelihood estimate with a multi-aperture camera and semi-photon-counting-level CMOS image sensors Haruki Ishida, Keiichiro Kagawa, Min-Woong Seo (Shizuoka Univ.), Takashi Komuro (Saitama Univ.), Bo Zhang, Taishi Takasawa, Keita Yasutomi, Shoji Kawahito (Shizuoka Univ.) |
We are aiming at realizing an ultra-high sensitivity low-noise camera with a semi-photon-counting-level CMOS image senso... [more] |
IST2016-45 pp.15-18 |
IST |
2016-09-26 15:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
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[more] |
IST2016-46 pp.19-22 |
IST |
2016-09-26 16:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
White Spots Reduction by Ultimate Proximity Metal Gettering at Carbon Complexes Formed underneath Contact Area in CMOS Image Sensors Tadashi Yamaguchi, Tomohiro Yamashita (Renesas), Takeshi Kamino, Yotaro Goto, Takashi Kuroi (RSMC), Masazumi Matsuura (Renesas) |
[more] |
IST2016-47 pp.23-26 |
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