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Technical Group on Information Sensing Technologies (IST) (Searched in: 2010)
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Search Results: Keywords 'from:2010-09-27 to:2010-09-27'
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| [Go to Official IST Homepage (Japanese)] |
| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Ascending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2010-09-27
13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Memorial Lecture]
Special Program, "Fortieth Anniversary Speech of the Born of CCD - at the Dawn"
Shigeyuki Ochi |
Milestone events and episodes of CCD Development and Commercialization are mainly described during about twenty years f... [more] |
IST2010-42
pp.1-8 |
| IST |
2010-09-27
13:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Multi-Core Utilization Technology
-- Domain Separation and Context-Aware Resource Allocation --
Masato Edahiro (NEC) |
[more] |
IST2010-43
pp.9-12 |
| IST |
2010-09-27
14:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Memorial Lecture]
[Commemorative Speech] Japan in the World of Image Sensors
-- What Japan has been playing the role of and What could be learnt from the History --
Takao Kuroda (Panasonic) |
After an overview of the early image sensor technologies, the technological transition in the dawn of Japan is reviewed.... [more] |
IST2010-44
pp.13-20 |
| IST |
2010-09-27
15:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Analysis on Characteristics of Light Transmission for multiple-metal layer nano-meter CMOS
Makoto Ikeda (University of Tokyo) |
[more] |
IST2010-45
pp.21-24 |
| IST |
2010-09-27
16:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Performance Improvements of Polarization-Analyzing Image Sensor using 65nm CMOS process
Sanshiro Shishido, Toshihiko Noda, Kiyotaka Sasagawa, Takashi Tokuda, Jun Ohta (NAIST) |
[more] |
IST2010-46
pp.25-28 |
| IST |
2010-09-27
16:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Techniques for high accurate and fast measurement of RTN and fabrication process conditions having a strong influence on RTN characteristics
Kenichi Abe, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) |
Physical analysis and reduction of random telegraph noise (RTN), which has become a major problem on advanced CMOS image... [more] |
IST2010-47
pp.29-32 |
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