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ITE: The Institute of Image Information and Television Engineers  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 559  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
09:00
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
[Invited Talk] A 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Oxide Based Full Trench Isolation for Large Full Well Capacity and High Quantum Efficiency
Koichiro Zaitsu, Akira Matsumoto, Mizuki Nishida, Yusuke Tanaka, Hirofumi Yamashita, Yosuke Satake (Sony Semiconductor Solutions), Takashi Watanabe, Kunihiko Araki, Naoki Nei (Sony Semiconductor Manufacturing), Keiichi Nakazawa, Junpei Yamamoto, Mutsuo Uehara (Sony Semiconductor Solutions), Hiroyuki Kawashima, Yusaku Kobayashi (Sony Semiconductor Manufacturing), Tomoyuki Hirano, Keiji Tatani (Sony Semiconductor Solutions)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
09:45
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
[Invited Talk] Low-Noise Multi-Gate Pixel Transistor for Sub-Micron Pixel CMOS Image Sensors
Naohiko Kimizuka, Shota Kitamura, Akiko Honjo, Koichi Baba, Toshihiro Kurobe, Hideomi Kumano, Takuya Toyohuku (Sony Semiconductor Solutions), Kouhei Takeuchi, Shota Nishimura (Sony Semiconductor Manufacturing), Akihiko Kato, Tomoyuki Hirano, Yusuke Oike (Sony Semiconductor Solutions)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
10:45
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
[Invited Talk] 0.37 W, 143 dB Dynamic Range 1 Megapixel Backside-Illuminated Charge Focusing SPAD Image Sensor with Pixel-Wise Exposure Control and Adaptive Clocked Recharging
Yu Maehashi, Yasuharu Ota, Kazuhiro Morimoto, Tomoya Sasago, Mahito Shinohara, Yukihiro Kuroda, Wataru Endo, Shintaro Maekawa, Masanao Motoyama, Kenzo Tojima, Hiroyuki Tsuchiya, Ayman Abdelghafar, Kosei Uehira, Junji Iwata, Fumihiro Inui, Yasushi Matsuno, Katsuhito Sakurai, Takeshi Ichikawa (Canon)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
11:30
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
[Invited Talk] Optimal Cell Structure/Operation Design of 3D Semicircular Split-gate Cells for Ultra-high-density Flash Memory
Tetsu Morooka (Kioxia)
 [more]
3DMT 2022-08-08
13:10
    [Invited Talk] Optoelectronics Technologies for Human Communication in Cyber-physical Society
Hideaki Takada (Nagasaki Univ.)
(To be available after the conference date) [more]
3DMT 2022-08-08
13:50
    [Invited Talk] Low Vision Aid, Vision Healthcare, and Augmented Vision by Retinal Imaging Laser Technology
Mitsuru Sugawara (QDLaser)
 [more]
3DMT 2022-08-08
14:30
    [Invited Talk] Holographic contact lens display
Yasuhiro Takaki (TUAT)
 [more]
3DMT 2022-08-08
15:30
    [Invited Talk] Present status and prospects of artificial vision
Jun Ohta (NAIST)
 [more]
3DMT 2022-08-08
16:10
    [Invited Talk] Perspectives on neural reconstruction of mental images
Yukiyasu Kamitani (Kyoto Univ.)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
13:15
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
[Invited Talk] Research on Steep Slope "PN-Body Tied SOI-FET" for Ultra Low Power LSI
Jiro Ida, Takayuki Mori (Kanazawa IT)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
14:00
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
Evaluation of Steep Subthreshold Slope Device "Dual-gate PN-body Tied SOI-FET" for Ultra-low Voltage Operation
Haruki Yonezaki, Jiro Ida, Takayuki Mori (KIT), Koichiro Ishibashi (UEC)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
14:25
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
Sub-50-mV Input Boost Converter for Extremely Low-Voltage Thermal Energy Harvesting
Hikaru Sebe, Daisuke Kanemoto, Tetsuya Hirose (Osaka Univ.)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
15:05
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
Evaluation of Backside Voltage Disturbance Impacts and IC Chip Response in Flip Chip Packaging
Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa (Kobe Univ.), Kikuo Muramatsu (e-SYNC), Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo (Megachips), Takuji Miki, Makoto Nagata (Kobe Univ.)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
15:30
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
Evaluation of Low-Latency Cryptography MANTIS based Low-Power oriented Tamper-Resistant Circuit
Kosuke Hamaguchi, Shu Takemoto, Yusuke Nozaki, Masaya Yoshikawa (Meijo Univ.)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
15:55
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
A cryogenic digital-to-analog converter for high-fidelity control of large-scale qubit arrays
Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
16:20
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
[Invited Talk] A 3.3-GHz 4.6-mW Fractional-N Type-II Hybrid Switched-Capacitor Sampling PLL Using CDAC-Embedded Digital Integral Path with -80-dBc Reference Spur
Zule Xu, Masaru Osada, Tetsuya Iizuka (UTokyo)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-09
09:20
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
[Invited Talk] A low-power low-noise magnetoimpedance-based magnetometer with digital calibration technique
Ippei Akita (AIST), Takeshi Kawano, Hitoshi Aoyama, Shunichi Tatematsu (Aichi Steel Corp.), Masakazu Hioki (AIST)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-09
10:05
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
[Invited Talk] A 38µm Range Precision Time-of-Flight CMOS Range Line Imager with Gating Driver Jitter Reduction Using Charge-Injection Pseudo Photocurrent Reference
Keita Yasutomi, Tatsuki Furuhashi, Koki Sagawa, Taishi Takasawa, Keiichiro Kagawa, Shoji Kawahito (Shizuoka Univ.)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-09
11:05
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
[Invited Talk] Effect of Conduction Band Edge States on Coulomb-Limiting Electron Mobility in Cryogenic MOSFET Operation
Hiroshi Oka, Takumi Inaba, Shota Iizuka, Hidehiro Asai, Kimihiko Kato, Takahiro Mori (AIST)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-09
11:50
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
TCAD Analysis for threshold voltage increase in cryogenic MOSFET operation
Hidehiro Asai, Takumi Inaba, Junichi Hattori, Koichi Fukuda, Hiroshi Oka, Takahiro Mori (AIST)
 [more]
 Results 1 - 20 of 559  /  [Next]  
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