| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2026-03-27
14:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 2.1 μm Single-Exposure 129 dB Dynamic Range CMOS Image Sensor with Triple Readout Technique
Ryosuke Nakamura, Takaya Yamanaka, Shunsuke Kasashima, Chie Tokumitsu, Masatoshi Kitajima, Rikuya Matano, Takeshi Ishizaki, Hiroaki Iga, Makoto Aoki (SSS), Shohei Nabeyoshi, Masashi Takami, Shuto Kuwahara (SCK), Yorito Sakano, Yusuke Oike (SSS) |
[more] |
IST2026-23
pp.60-63 |
| IST |
2026-03-27
15:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 25M points/s Back-Illuminated Stacked SPAD Direct Time-of-Flight Depth Sensor with Equivalent Time Sampling and Pixel-Level Threshold Control for Automotive LiDAR
Katsuhiko Hanzawa, Tatsuya Yui, Masahiro Hosoya, Yuqing Liu, Tadashi Yasufuku, Yoshinori Tanaka, Yoshiaki Tashiro, Albert Tumewu (SSS), Masataka Yamane, Masatoshi Shibata, Toshiki Sakada (SCK), Kazuhisa Akatsuka, Yudai Matsushita (SSS), Koki Yamada, Kouji Mori (SCK), Takahiro Toyoshima, Yorito Sakano, Oichi Kumagai, Kenichi Tsunoji, Masayuki Takahashi (SSS) |
This paper presents technologies at Single Photon Avalanche Diode (SPAD) direct Time-of-flight (ToF) depth sensor and Li... [more] |
IST2026-26
pp.74-78 |
| IST |
2025-03-21
13:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A Color Image Sensor Using 1.0-μm Organic Photoconductive Film Pixels Stacked on 4.0-μm Si Pixels for Near-Infrared Time-of-Flight Depth Sensing
Nobuhiro Kawai, Tomohiro Ohkubo, Kimiyasu Shiina, Kei Fukuhara, Ryotaro Takaguchi, Tetsuro Takada (SSS), Yoshito Nagashima, Takahito Niwa (SCK), Masahiro Joei, Kensaku Maeda, Tomoyuki Hirano, Atsushi Suzuki, Hideaki Togashi, Tetsuji Yamaguchi, Yusuke Oike (SSS) |
[more] |
IST2025-14
pp.18-22 |
| IST |
2024-03-27
10:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
216 fps 672 × 512 pixel 3 μm Indirect Time-of-Flight Image Sensor with 1-Frame Depth Acquisition for Motion Artifact Suppression
Chihiro Okada, Sozo Yokogawa, Yuhi Yorikado, Katsumi Honda, Naoki Okuno, Ryohei Ikeno, Makoto Yamakoshi, Hiroshi Ito (SSS), Shohei Yoshitsune, Masatsugu Desaki, Shota Hida (SCK), Atsushi Nose, Hayato Wakabayashi, Fumihiko Koga (SSS) |
[more] |
IST2024-11
pp.1-3 |
| IST |
2024-03-27
15:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 3.36 µm-pitch SPAD photon-counting image sensor using clustered multi-cycle clocked recharging technique with intermediate most-significant-bit readout
Takafumi Takatsuka, Jun Ogi, Yasuji Ikeda, Kazuki Hizu, Yutaka Inaoka, Shunsuke Sakama, Iori Watanabe, Tatsuya Ishikawa, Shohei Shimada, Junki Suzuki (SSS), Hidenori Maeda, Kenji Toshima (SCK), Yusuke Nonaka, Akifumi Yamamura, Hideki Ozawa, Fumihiko Koga, Yusuke Oike (SSS) |
This paper introduces the pixel front-end (PFE) circuit pitch reduction of SPAD photon count image sensor, which was rep... [more] |
IST2024-21
pp.42-45 |
| IST |
2023-09-15
14:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
High Full Well Capacity and Low Noise Characteristics in 0.6 μm Pixels via Buried Sublocal Connections in a 2-Layer Transistor Pixel Stacked CMOS Imager Sensor
Keiji Nishida, Masataka Sugimoto, Tatsuya Okawa, Kanta Suzuki, Tomoharu Ogita, Katsunori Hiramatsu, Tomoyuki Hirano, Yoshiaki Kikuchi (SSS), Yuji Nishimura, Kohei Takeuchi, Daisuke Yoneyama, Toru Nagaki, Noriteru Yamada, Hiroyuki Kawashima (SCK), Yoshiaki Kitano (SSS) |
[more] |
IST2023-42
pp.29-32 |
| IST |
2022-09-22
13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Oxide Based Full Trench Isolation for Large Full Well Capacity and High Quantum Efficiency
Chihiro Tomita, Koichiro Zaitsu, Akira Matsumoto, Mizuki Nishida, Yusuke Tanaka, Hirofumi Yamashita, Yusuke Satake (SSS), Takashi Watanabe, Kunihiko Araki, Naoki Nei (SCK), Keiichi Nakazawa, Junpei Yamamoto, Mutsuo Uehara (SSS), Hiroyuki Kawashima, Yusaku Kobayashi (SCK), Tomoyuki Hirano, Keiji Tatani (SSS) |
[more] |
IST2022-34
pp.1-4 |
| IST |
2022-09-22
14:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
Low-Noise Multi-Gate Pixel Transistor for Sub-Micron Pixel CMOS Image Sensors
Koichi Baba, Shota Kitamura, Naohiko Kimizuka, Akiko Honjo, Toshihiro Kurobe, Hideomi Kumano, Takuya Toyofuku (SSS), Kouhei Takeuchi, Shota Nishimura (SCK), Akihiko Kato, Tomoyuki Hirano, Yusuke Oike (SSS) |
As the pixel size of CMOS image sensors (CIS) is rapidly decreasing to sub-micron pixels due to strong demand from mobil... [more] |
IST2022-35
pp.5-8 |
| IST |
2022-03-28
13:40 |
Online |
|
A 2.9μm Pixel CMOS Image Sensor for Security Cameras with high FWC and 97 dB Single-Exposure Dynamic Range
Masashi Ohura, Tetsuya Uchida, Kazuyoshi Yamashita, Atsushi Masagaki, Tomohiko Kawamura, Chie Tokumitsu, Takashi Onizawa, Hisahiro Ansai, Kazutaka Izukashi, Shinichi Yoshida (SSS), Takamasa Tanikuni, Susumu Hiyama (SCK), Tomoyuki Hirano, Shinji Miyazawa, Yasushi Tateshita (SSS) |
[more] |
IST2022-17
pp.31-34 |
| IST |
2021-03-26
15:50 |
Tokyo |
Online |
|
[more] |
IST2021-19
pp.45-48 |
| IST |
2020-03-27
17:40 |
Tokyo |
Kikaishinko kaikan
(Postponed) |
A 132dB single-exposure dynamic range, CMOS image sensor with high-temperature tolerance
Takahiro Toya, Yorito Sakano, Takahiro Toyoshima, Ryosuke Nakamura, Tomohiko Asatsuma, Yuki Hattori (SSS), Takayuki Yamanaka, Ryoichi Yoshikawa (SCK), Naoki Kawazu, Tomohiro Matsuura, Takahiro Iinuma, Tomohiko Watanabe, Atsushi Suzuki, Yuichi Motohashi, Junichiro Azami, Yasushi Tateshita, Tsutomu Haruta (SSS) |
[more] |
IST2020-26
pp.85-88 |
| IST |
2019-09-20
11:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Sub-pixel architecture of CMOS Image Sensor achieving over 120dB Dynamic-Range with less Moton Artifact
Satoko Iida, T. Asatsuma, Y. Sakano (SSS), M. Takami (SCK), I. Yoshiba (SSS), N. Ohba (SCK), H. Mizuno, T. Oka, K. Yamaguchi, A. Suzuki, K. Suzuki, M. Yamada, Y. Tateshita, K. Ohno (SSS) |
[more] |
IST2019-45
pp.9-12 |
| IST |
2019-03-22
09:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
0.68e rms RandomNoise 121dB DynamicRange Sub pixel architecture CMOS Image Sensor with LED Flicker Mitigation
Mizuno Hiroyuki, Satoko Iida, Yorito Sakano, Tomohiko Asatsuma (SSS), Masashi Takami (SCK), Ippei Yoshiba, Nobuyuki Ohba, Takumi Oka, Kazunori Yamaguchi, Atsushi Suzuki, Keita Suzuki, Manabu Yamada, Yasushi Tateshita, Keiichi Ohno (SSS) |
This is a report of a CMOS image sensor with a sub-pixel architecture having a pixel pitch of 3 µm. The aforementioned s... [more] |
IST2019-12
pp.1-6 |
| IST |
2019-03-22
11:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Back-Illuminated 2.74 μm-Pixel-Pitch Global Shutter CMOS Image Sensor with Charge-Domain Memory Achieving a 10k e- Saturation Signal
Yoshimichi Kumagai, Ryoto Yoshita, Naoyuki Osawa, Harumi Ikeda, Kazuyoshi Yamashita, Takashi Abe, Shigetaka Kudoh (SSS), Junji Yamane, Tooru Idekoba, Shinichiro Nohdo, Yuma Ono, Sachihito Kunitake, Mitsuru Sato, Naoyuki Sato, Takayuki Enomoto (SCK), Keiichi Nakazawa, Hiroyuki Mori, Yasushi Tateshita, Keiichi Ohno (SSS) |
[more] |
IST2019-16
pp.21-25 |
| IST, CE |
2012-03-30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Extremely-Low-Noise CMOS Image Sensor with High Saturation Capacity
Kazuichiroh Itonaga, Kyohei Mizuta, Toyotaka Kataoka, Harumi Ikeda, Masashii Yanagita, Hiroaki Ishiwata, Yusuke Tanaka, Takashi Wakano, Yoshihisa Matoba, Tetsuya Oishi, Ryou Yamamoto, Shinichi Arakawa, Jun Komachi, Mikio Katsumata, Shinya Watanabe (Sony) |
We have developed a flat device structure, which we call “FLAT”, with no isolation grooves/ridges and no Si substrate et... [more] |
|
| IST, CE |
2010-03-26
16:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
0.9um Pitch Pixel CMOS Image Sensor Device Design Methodology
Kazuichiro Itonaga, Kyohei Mizuta, Toyotaka Kataoka (Sony), Masashi Yanagita, Shintaro Yamauchi (SCK), Ikeda Harumi, Tsutomu Haruta, Shizunori Matsumoto (Sony), Masanori Harasawa, Takeshi Matsuda, Akira Matsumoto (SCK), Ikue Mizuno (Sony), Takatoshi Kameshima, Iwao Sugiura (SCK), Teruo Hirayama (Sony) |
We proposed the constant-light-diffraction methodology in order to design the CMOS image sensor (CIS).
We developed a... [more] |
IST2010-20 CE2010-29
pp.55-58 |
|