| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2026-03-27
10:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A Back-illuminated 10 μm-pitch SPAD Depth Sensor with 42.5% PDE at 940 nm using an Optimized Doping Design
Shohei Shimada, Yusuke Otake, Junki Suzuki, Aoi Magori, Kenji Kurata, Tomonori Matsui, Ryoya Tsuchida (Sony Semiconductor Solutions), Mutsumi Okazaki (Sony), Kaito Yokochi, Toshihito Iwase, Hiroaki Takase, Fumihiko Koga, Jun Ogi (Sony Semiconductor Solutions), Hidenori Maeda, Koji Moriyama, Hideyuki Honda (Sony Semiconductor Manufacturing), Kaoru Fujisawa, Takahiro Miura, Hiroaki Kouketsu, Toshifumi Wakano (Sony Semiconductor Solutions) |
[more] |
IST2026-16
pp.28-31 |
| IST |
2026-03-27
11:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
10 µm Pitch Ge-on-Si SPAD Pixel Array with PDE of 33.8% at 1300 nm and 23.3% at 1550 nm under Room Temperature Environment
Satoru Yoshida, Shohei Shimada, Atsushi Matsuzaki, Sylvia Loo Mei Lin, Yusuke Otake, Tetsuji Nagayama, Soichi Ochiai, Takashi Tange, Ken Sasaki, Atsuhito Yasui, Kaito Yokochi, Hiroaki Takase, Katsuaki Sasaki, Masaru Miyashita, Tetsu Ono (Sony Semiconductor Solutions), Kazuma Takahashi, Hirotaka Tanaka, Ryu Sasaki, So Mitoma (Sony Semiconductor Manufacturing), Toshifumi Wakano (Sony Semiconductor Solutions) |
[more] |
IST2026-17
pp.32-35 |
| IST |
2026-03-27
14:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 2.1 μm Single-Exposure 129 dB Dynamic Range CMOS Image Sensor with Triple Readout Technique
Ryosuke Nakamura, Takaya Yamanaka, Shunsuke Kasashima, Chie Tokumitsu, Masatoshi Kitajima, Rikuya Matano, Takeshi Ishizaki, Hiroaki Iga, Makoto Aoki (SSS), Shohei Nabeyoshi, Masashi Takami, Shuto Kuwahara (SCK), Yorito Sakano, Yusuke Oike (SSS) |
[more] |
IST2026-23
pp.60-63 |
| IST |
2026-03-27
15:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 25M points/s Back-Illuminated Stacked SPAD Direct Time-of-Flight Depth Sensor with Equivalent Time Sampling and Pixel-Level Threshold Control for Automotive LiDAR
Katsuhiko Hanzawa, Tatsuya Yui, Masahiro Hosoya, Yuqing Liu, Tadashi Yasufuku, Yoshinori Tanaka, Yoshiaki Tashiro, Albert Tumewu (SSS), Masataka Yamane, Masatoshi Shibata, Toshiki Sakada (SCK), Kazuhisa Akatsuka, Yudai Matsushita (SSS), Koki Yamada, Kouji Mori (SCK), Takahiro Toyoshima, Yorito Sakano, Oichi Kumagai, Kenichi Tsunoji, Masayuki Takahashi (SSS) |
This paper presents technologies at Single Photon Avalanche Diode (SPAD) direct Time-of-flight (ToF) depth sensor and Li... [more] |
IST2026-26
pp.74-78 |
| IST |
2025-09-18
11:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A 2.1μm High Dynamic Range CMOS Image Sensor with Sub-pixel and Lateral Overflow Integration Capacitor Architecture
Shunta Noguchi, Satoko Iida, Naoya Sato, Shinichiro Izawa, Takayuki Yamanaka, Yorito Sakano, Yusuke Oike (Sony) |
This is a report on an Automotive CMOS image sensor using a pixel architecture of 2.1μm Sub-pixel and Lateral Overflow I... [more] |
IST2025-38
pp.9-12 |
| IST |
2025-03-21
13:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A Color Image Sensor Using 1.0-μm Organic Photoconductive Film Pixels Stacked on 4.0-μm Si Pixels for Near-Infrared Time-of-Flight Depth Sensing
Nobuhiro Kawai, Tomohiro Ohkubo, Kimiyasu Shiina, Kei Fukuhara, Ryotaro Takaguchi, Tetsuro Takada (SSS), Yoshito Nagashima, Takahito Niwa (SCK), Masahiro Joei, Kensaku Maeda, Tomoyuki Hirano, Atsushi Suzuki, Hideaki Togashi, Tetsuji Yamaguchi, Yusuke Oike (SSS) |
[more] |
IST2025-14
pp.18-22 |
| IST |
2025-03-21
14:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 2.1-ns Dead Time 5-μm Single Photon Avalanche Diode with 2-layer Transistor Pixel Technology
Shota Kitamura, Jun Ogi, Fumitaka Sugaya, Junki Suzuki, Aoi Magori, Tomonori Matsui, Kei Sumita, Yuki Ushiku (Sony Semiconductor Solutions), Koji Moriyama, Kenji Toshima (Sony Semiconductor Manufacturing), Tomohiro Namise, Hideki Ozawa, Yasunori Tsukuda, Yusuke Otake, Hiroki Hiyama, Shizunori Matsumoto, Atsushi Suzuki, Fumihiko Koga (Sony Semiconductor Solutions) |
This study reports a 5-$mu$m-pitch single photon avalanche diode (SPAD) with 2-layer transistor pixel technology. The de... [more] |
IST2025-16
pp.27-31 |
| ME |
2025-02-22
12:45 |
Online |
online |
Few-shot 3D Human Action Anomaly Detection
Koichiro Kamide (UT), Chunzhi Gu (TUT), Shun Maeda (UF), Jun Yu (NU), Chao Zhang (UT) |
Anomaly detection for human action aims to identify action patterns that deviate from the expected behavior. Collecting ... [more] |
ME2025-48
pp.29-32 |
| BCT, KYUSHU, IEEE-BT, IEEE-AP-S-FUKUOKA |
2025-01-31
09:55 |
Kumamoto |
Kumamoto Univ., Kurokami Minami Dist., Kurokami Minami W3
(Primary: On-site, Secondary: Online) |
Basic study of the dual-band operation of patch antennas loaded with a dielectric-resonator array with high dielectric constant
Ippei Kusunose, Makoto Sano (Kumamoto Univ.), Koichiro Hyodo, Masaya Nishida (Murata Mfg.), Ryuji Kuse, Takeshi Fukusako (Kumamoto Univ.) |
[more] |
BCT2025-14
pp.50-53 |
| IEICE-MRIS, MMS |
2024-06-06
15:00 |
Miyagi |
RIEC, Tohoku Univ.
(Primary: On-site, Secondary: Online) |
High rate RF sputtering of MgO underlayer by hot cathode method with porous target for heat asissted magnetic recording media
Kota Yamada, Daiki Miyazaki, Yuki Hirokawa, Seong-Jae Jeon, Akihiro Shimizu (Tohoku Univ.), Kosaku Iwatani (TOSHIMA Manufacturing Co., Ltd.), Shintaro Hinata, Tomoyuki Ogawa, Shin Saito (Tohoku Univ.) |
[more] |
|
| HI, IEICE-MVE, VRSJ, HI-SIG-DeMO, IPSJ-HCI, IPSJ-EC [detail] |
2024-06-06
16:00 |
Tokyo |
(Primary: On-site, Secondary: Online) |
Video See-through HMD with Camera-eye Positional Matching by Parallel Pancake Window Optical System
Kazumasa Taniguchi (AISIN), Daiki Nokura, Ryugo Kijima (Gufu Univ.) |
In typical video see-through head-mounted displays (HMDs), there is a discrepancy between the user's viewpoint and the c... [more] |
|
| IST |
2024-03-27
10:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
216 fps 672 × 512 pixel 3 μm Indirect Time-of-Flight Image Sensor with 1-Frame Depth Acquisition for Motion Artifact Suppression
Chihiro Okada, Sozo Yokogawa, Yuhi Yorikado, Katsumi Honda, Naoki Okuno, Ryohei Ikeno, Makoto Yamakoshi, Hiroshi Ito (SSS), Shohei Yoshitsune, Masatsugu Desaki, Shota Hida (SCK), Atsushi Nose, Hayato Wakabayashi, Fumihiko Koga (SSS) |
[more] |
IST2024-11
pp.1-3 |
| IST |
2024-03-27
15:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 3.36 µm-pitch SPAD photon-counting image sensor using clustered multi-cycle clocked recharging technique with intermediate most-significant-bit readout
Takafumi Takatsuka, Jun Ogi, Yasuji Ikeda, Kazuki Hizu, Yutaka Inaoka, Shunsuke Sakama, Iori Watanabe, Tatsuya Ishikawa, Shohei Shimada, Junki Suzuki (SSS), Hidenori Maeda, Kenji Toshima (SCK), Yusuke Nonaka, Akifumi Yamamura, Hideki Ozawa, Fumihiko Koga, Yusuke Oike (SSS) |
This paper introduces the pixel front-end (PFE) circuit pitch reduction of SPAD photon count image sensor, which was rep... [more] |
IST2024-21
pp.42-45 |
| IST |
2023-09-15
13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
Tap mismatch mitigation of 3µm 2tap pixels of indirect Time-of-Flight image sensor for high-speed depth mapping
Mizuki Akaike, Yuhi Yorikado, Sozo Yokogawa, Chihiro Okada, Komomo Kodama, Risa Iwashita, Katsumi Honda, Takahiro Hamasaki, Shohei Yoshitsune, Yuki Hanabusa, Kei Nagoya, Masatsugu Desaki, Shota Hida, Hayato Wakabayashi, Koga Fumihiko (Sony) |
[more] |
IST2023-38
pp.13-16 |
| IST |
2023-09-15
13:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 3.0µm-pixels and 1.5µm-pixels combined CMOS Image Sensor for Viewing and Sensing Applications with 106dB Dynamic Range, High-Sensitivity, LED-Flicker Mitigation and Motion Blur-less
Takaya Yamanaka, Satoko Iida, Yorito Sakano, Daisuke Kawamata, Tomohiro Matsuura, Masahiro Toshida, Masahiro Baba, Hidetoshi Katayama, Junichiro Azami, Shohei Nabeyoshi, Nobuhiko Fujimori, Sungin Han, Adarsh Basavalingappa (Sony) |
[more] |
IST2023-40
pp.21-24 |
| IST |
2023-09-15
14:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
High Full Well Capacity and Low Noise Characteristics in 0.6 μm Pixels via Buried Sublocal Connections in a 2-Layer Transistor Pixel Stacked CMOS Imager Sensor
Keiji Nishida, Masataka Sugimoto, Tatsuya Okawa, Kanta Suzuki, Tomoharu Ogita, Katsunori Hiramatsu, Tomoyuki Hirano, Yoshiaki Kikuchi (SSS), Yuji Nishimura, Kohei Takeuchi, Daisuke Yoneyama, Toru Nagaki, Noriteru Yamada, Hiroyuki Kawashima (SCK), Yoshiaki Kitano (SSS) |
[more] |
IST2023-42
pp.29-32 |
| IST |
2023-03-27
15:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A SPAD Depth Sensor Robust Against Ambient Light : The Importance of Pixel Scaling and Demonstration of a 2.5um Pixel with 21.8% PDE at 940nm
Shohei Shimada, Yusuke Otake, Satoru Yoshida, Yuma Jibiki, Motoharu Fujii, Suzunori Endo, Ryoichi Nakamura, Hidenobu Tsugawa, Yutaro Fujisaki, Kaito Yokochi, Toshihito Iwase, Kosaku Takabayashi, Hidenori Maeda, Keiji Sugihara, Koji Yamamoto, Makoto Ono, Kenzo Ishibashi, Shizunori Matsumoto, Hiroki Hiyama, Toshifumi Wakano (Sony) |
[more] |
IST2023-10
pp.19-22 |
| IST |
2022-09-22
13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Oxide Based Full Trench Isolation for Large Full Well Capacity and High Quantum Efficiency
Chihiro Tomita, Koichiro Zaitsu, Akira Matsumoto, Mizuki Nishida, Yusuke Tanaka, Hirofumi Yamashita, Yusuke Satake (SSS), Takashi Watanabe, Kunihiko Araki, Naoki Nei (SCK), Keiichi Nakazawa, Junpei Yamamoto, Mutsuo Uehara (SSS), Hiroyuki Kawashima, Yusaku Kobayashi (SCK), Tomoyuki Hirano, Keiji Tatani (SSS) |
[more] |
IST2022-34
pp.1-4 |
| IST |
2022-09-22
14:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
Low-Noise Multi-Gate Pixel Transistor for Sub-Micron Pixel CMOS Image Sensors
Koichi Baba, Shota Kitamura, Naohiko Kimizuka, Akiko Honjo, Toshihiro Kurobe, Hideomi Kumano, Takuya Toyofuku (SSS), Kouhei Takeuchi, Shota Nishimura (SCK), Akihiko Kato, Tomoyuki Hirano, Yusuke Oike (SSS) |
As the pixel size of CMOS image sensors (CIS) is rapidly decreasing to sub-micron pixels due to strong demand from mobil... [more] |
IST2022-35
pp.5-8 |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-08
09:00 |
Online |
On-line |
[Invited Talk]
A 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Oxide Based Full Trench Isolation for Large Full Well Capacity and High Quantum Efficiency
Koichiro Zaitsu, Akira Matsumoto, Mizuki Nishida, Yusuke Tanaka, Hirofumi Yamashita, Yosuke Satake (Sony Semiconductor Solutions), Takashi Watanabe, Kunihiko Araki, Naoki Nei (Sony Semiconductor Manufacturing), Keiichi Nakazawa, Junpei Yamamoto, Mutsuo Uehara (Sony Semiconductor Solutions), Hiroyuki Kawashima, Yusaku Kobayashi (Sony Semiconductor Manufacturing), Tomoyuki Hirano, Keiji Tatani (Sony Semiconductor Solutions) |
[more] |
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