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Paper #
IEICE-SDM
,
IEICE-ICD
,
IST
[detail]
2025-08-07
11:10
Hokkaido
Hokkaido Univ. Prmaceutical of Science
(Primary: On-site, Secondary: Online)
Investigating the Temperature Dependence of Silicon Qubit Fidelity through Simulations Considering Charge Noise
Yudai Sato
(
TUS/AIST
),
Hidehiro Asai
,
Takahiro Mori
(
AIST
),
Takayuki Kawahara
(
TUS
)
[more]
ME
2012-02-18
10:30
Kanagawa
Kando Gakuin Univ.
Modeling of Three-Dimensional Map of Haul Road Environment using Distance Sensor Images
Dai Sato
,
Yuuma Iwao
,
Toshiyuki Gotho
(
YNU
),
Hideyuki Wakai
(
KOMATSU
)
[more]
ME2012-13
pp.49-52
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