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IEICE-EID, IEICE-SDM, IDY [detail] 2018-12-25
13:45		 Kyoto   Effect of Ar-cluster irradiation on DNA/Si-MOSFET
Hibiki Nakano, Naoto Mastuo, Akira Heya, Kazushige Yamana, Tadao Takada, Kousuke Moritani, Norio Inui, Yu Sato (Univ. Hyogo), Tadashi Sato, Shin Yokoyama (Hiroshima Univ.) 		 [more]
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