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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IEICE-OCS, IEICE-OFT, IEE-CMN, BCT [detail] |
2023-11-10
10:35 |
Kyoto |
(Primary: On-site, Secondary: Online) |
High-accuracy distributed strain sensing based on low-coherence BOCDR: simulation and experimental validation
Kenta Otsubo, Guangtao Zhu, Takaki Kiyozumi (YNU), Hiroshi Takahashi (YNU/NTT), Yusuke Koshikiya (NTT), Yosuke Mizuno (YNU) |
As a principle of distributed measurement of strain and temperature along an optical fiber, the strain/temperature depen... [more] |
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| IST |
2018-03-09
12:00 |
Tokyo |
NHK Housou-Gijyutu Lab. |
[Invited Talk]
Pixel/DRAM/logic 3-layer stacked CMOS image sensor technology
Hidenobu Tsugawa, Hiroshi Takahashi, Ryoichi Nakamura, Taku Umebayashi, Tomoharu Ogita, Hitoshi Okano, Kazuya Iwase, Hiroyuki Kawashima, Takatsugu Yamasaki, Daisuke Yoneyama, Jun Hashizume, Tsutomu Nakajima, Kenichi Murata, Yoshikazu Kanaishi, Kenji Ikeda, Keiji Tatani, Hajime Nakayama, Tsutomu Haruta, Tetsuo Nomoto (Sony) |
[more] |
IST2018-17
pp.25-29 |
| IST |
2017-03-10
13:20 |
Tokyo |
NHK Research Lab. Auditorium (Setagaya) |
A 1/2.3in 20Mpixel 3-Layer Stacked CMOS Image Sensor with DRAM
Tsutomu Haruta, Tsutomu Nakajima, Jun Hashizume, Taku Umebayashi, Hiroshi Takahashi, Kazuo Taniguchi, Masami Kuroda, Hiroshi Sumihiro, Koji Enoki (Sony Semiconductor Solutions), Takatsugu Yamasaki (Sony Semiconductor Manufacturing), Katsuya Ikezawa, Atsushi Kitahara, Masao Zen, Masafumi Oyama, Hiroki Koga (Sony Semiconductor Solutions) |
[more] |
IST2017-13
pp.19-22 |
BCT, IEICE-OFT, IEICE-OCS, IEE-CMN
(Joint) [detail] |
2016-11-11
13:10 |
Nagasaki |
CORE COMMUNICATION IN NAGASAKI |
Brillouin dynamic strain measurement employing frequency-swept pulses
Chihiro Kito, Hiroshi Takahashi, Kunihiro Toge, Tetsuya Manabe (NTT) |
[more] |
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| BCT, IEICE-OFT, IEE-CMN, IEICE-OCS [detail] |
2015-11-13
13:25 |
Ehime |
Matsuyama Civic Center |
Brillouin-based branched fiber monitoring using linear frequency-swept pump pulse
Hiroshi Takahashi, Chihiro Kito, Kunihiro Toge, Tetsuya Manabe (NTT) |
(Advance abstract in Japanese is available) [more] |
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| BCT, IEICE-OCS, IEICE-OFT, IEE-CMN [detail] |
2014-11-13
15:40 |
Hiroshima |
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Applicability of End Reflection Assisted Brillouin Analysis to Broken PON Monitoring
Chihiro Kito, Hiroshi Takahashi, Kunihiro Toge, Tetsuya Manabe (NTT), Fumihiko Ito (Shimane Univ) |
[more] |
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| IST |
2014-03-14
11:30 |
Tokyo |
NHK |
3D Stacked CMOS Image Sensor
Taku Umebayashi, Tomoharu Ogita, Shunichi Sukegawa, Tsutomu Nakajima, Hiroshi Kawanobe (Sony), Ken Koseki (Sony LSI Design), Tsutomu Haruta, Hiroshi Takahashi (Sony), Keishi Inoue (Sony Semiconductor), Toshifumi Wakano, Yusuke Mada, Koji Fukumoto, Takashi Nagano, Yoshikazu Nitta, Teruo Hirayama (Sony) |
We have developed 3D stacked CMOS image sensor. This technology is a Back-illuminated CIS stacking on a logic substrate.... [more] |
IST2014-9
p.5 |
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