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All Technical Committee Conferences (Searched in: Recent 10 Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| HI |
2025-03-18
10:35 |
Online |
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Quantitative evaluation of emotional changes Induced by lighting colors using AI
Naoya Kunisada, Hiroshi Takahashi (Kanagawa Institute of Technology Univ.) |
[more] |
HI2025-15
pp.1-3 |
| HI |
2025-03-18
11:00 |
Online |
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Effect of ipRGC response on contrast sensitivity in central vision
Masatoshi Ishigane, Takeru Kurashima, Hiroshi Takahashi (KAIT), Masahiro Suzuki (NDSU), Keiji Uchikawa (KAIT) |
[more] |
HI2025-16
pp.4-6 |
| IEICE-OCS, IEICE-OFT, IEE-CMN, BCT [detail] |
2023-11-10
10:35 |
Kyoto |
(Primary: On-site, Secondary: Online) |
High-accuracy distributed strain sensing based on low-coherence BOCDR: simulation and experimental validation
Kenta Otsubo, Guangtao Zhu, Takaki Kiyozumi (YNU), Hiroshi Takahashi (YNU/NTT), Yusuke Koshikiya (NTT), Yosuke Mizuno (YNU) |
As a principle of distributed measurement of strain and temperature along an optical fiber, the strain/temperature depen... [more] |
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| IST |
2018-03-09
12:00 |
Tokyo |
NHK Housou-Gijyutu Lab. |
[Invited Talk]
Pixel/DRAM/logic 3-layer stacked CMOS image sensor technology
Hidenobu Tsugawa, Hiroshi Takahashi, Ryoichi Nakamura, Taku Umebayashi, Tomoharu Ogita, Hitoshi Okano, Kazuya Iwase, Hiroyuki Kawashima, Takatsugu Yamasaki, Daisuke Yoneyama, Jun Hashizume, Tsutomu Nakajima, Kenichi Murata, Yoshikazu Kanaishi, Kenji Ikeda, Keiji Tatani, Hajime Nakayama, Tsutomu Haruta, Tetsuo Nomoto (Sony) |
[more] |
IST2018-17
pp.25-29 |
| IST |
2017-03-10
13:20 |
Tokyo |
NHK Research Lab. Auditorium (Setagaya) |
A 1/2.3in 20Mpixel 3-Layer Stacked CMOS Image Sensor with DRAM
Tsutomu Haruta, Tsutomu Nakajima, Jun Hashizume, Taku Umebayashi, Hiroshi Takahashi, Kazuo Taniguchi, Masami Kuroda, Hiroshi Sumihiro, Koji Enoki (Sony Semiconductor Solutions), Takatsugu Yamasaki (Sony Semiconductor Manufacturing), Katsuya Ikezawa, Atsushi Kitahara, Masao Zen, Masafumi Oyama, Hiroki Koga (Sony Semiconductor Solutions) |
[more] |
IST2017-13
pp.19-22 |
BCT, IEICE-OFT, IEICE-OCS, IEE-CMN
(Joint) [detail] |
2016-11-11
13:10 |
Nagasaki |
CORE COMMUNICATION IN NAGASAKI |
Brillouin dynamic strain measurement employing frequency-swept pulses
Chihiro Kito, Hiroshi Takahashi, Kunihiro Toge, Tetsuya Manabe (NTT) |
[more] |
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| BCT, IEICE-OFT, IEE-CMN, IEICE-OCS [detail] |
2015-11-13
13:25 |
Ehime |
Matsuyama Civic Center |
Brillouin-based branched fiber monitoring using linear frequency-swept pump pulse
Hiroshi Takahashi, Chihiro Kito, Kunihiro Toge, Tetsuya Manabe (NTT) |
(Advance abstract in Japanese is available) [more] |
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