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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2014-12-01
16:30 |
Tokyo |
Tamachi Campus, Tokyo Institute of Technology (Tokyo) |
[Poster Presentation]
A Resolution-Reconfigurable 12b-to-8b Successive-Approximation ADC for CMOS Image Sensor
Sun-Il Hwang, Hyeon-June Kim, Ji-Wook Kwon, Dong-Hwan Jin (KAIST), Jong-Ho Park (CISS), Seung-Tak Ryu (KAIST) |
[more] |
IST2014-80
pp.55-56 |
| IST |
2009-09-28
13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
Effects of Negative Bias Operation and Optical Stress on Dark Current
Takashi Watanabe, Jong-Ho Park, Satoshi Aoyama, Keigo Isobe (Brookman Tech.), Shoji Kawahito (Shizuoka Univ.) |
[more] |
IST2009-47
pp.5-8 |
| IST, CE |
2009-03-19
15:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
A High-Speed Low-Noise CMOS Image Sensor with 13b Column-Parallel Single-Ended Cyclic ADCs
Jong-Ho Park, Satoshi Aoyama, Takashi Watanabe, Tomoyuki Akahori, Tomohiko Kosugi, Keigo Isobe, Yuichi Kaneko, Zheng Liu, Kazuki Muramatsu, Takeshi Matsuyama (ブルックマン・ラボ), Shoji Kawahito (静岡大学) |
A CIS with 13b column-parallel cyclic ADC is presented. Single-ended architecture with lower read noise enables the imag... [more] |
IST2009-14 CE2009-34
pp.25-28 |
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