ITE Technical Group Submission System
Conference Schedule
Online Proceedings
[Sign in]
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
IEICE-SDM, IEICE-ICD, IST [detail] 2021-08-18
09:30
Online Online [Invited Talk] Analog in-memory computing in FeFET based 1T1R array for low-power edge AI applications
Daisuke Saito, Toshiyuki Kobayashi, Hiroki Koga (SONY), Yusuke Shuto, Jun Okuno, Kenta Konishi (SSS), Masanori Tsukamoto, Kazunobu Ohkuri (SONY), Taku Umebayashi (SSS), Takayuki Ezaki (SONY)
 [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2020-08-06
09:30
Online Online [Invited Talk] SoC compatible 1T1C FeRAM memory array based on ferroelectric Hf0.5Zr0.5O2 -- Report on 2020 IEEE VLSI Symposia --
Jun Okuno, Takafumi Kunihiro, Kenta Konishi, Fumitaka Sugaya, Yusuke Shuto, Hideki Maemura, Masanori Tsukamoto, Taku Umebayashi (SSS)
 [more]
IEICE-SDM, IEICE-ICD, IST [detail] 2017-07-31
11:15
Hokkaido Hokkaido-Univ. Multimedia Education Bldg. [Invited Talk] A cross point Cu-ReRAM with a novel OTS selector for storage class memory applications
Shuichiro Yasuda, Kazuhiro Ohba, Tetsuya Mizuguchi, Hiroaki Sei, Masayuki Shimuta, Katsuhisa Aratani, Tsunenori Shiimoto, Tetsuya Yamamoto, Takeyuki Sone, Seiji Nonoguchi, Jun Okuno, Akira Kouchiyama, Wataru Otsuka, Keichi Tsutsui (Sony Semiconductor Solutions)
 [more]
IST, CE 2012-03-30 Tokyo Kikai-Shinko-Kaikan Bldg. A Global-Shutter CMOS Image Sensor with In-Pixel Dual Storage
Masaki Sakakibara, Yusuke Oike, Takafumi Takatsuka, Akihiko Kato, Katsumi Honda, Tadayuki Taura, Takashi Machida (Sony), Jun Okuno, Atsuhiro Ando, Taketo Fukuro, Tomohiko Asatsuma, Suzunori Endo, Junpei Yamamoto, Yasuhiro Nakano, Takumi Kaneshige (SONY Semiconductor)
In this paper, we report a Global-Shutter CMOS Image Sensor with no picture distortion which caused due to line-scanned ... [more]
 Results 1 - 4 of 4  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format


[Return to Top Page]

[Return to ITE Web Page]


The Institute of Image Information and Television Engineers (ITE), Japan