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Committee Date Time Place Paper Title / Authors Abstract Paper #
IST 2010-09-27
Tokyo Kikai-Shinko-Kaikan Bldg. Techniques for high accurate and fast measurement of RTN and fabrication process conditions having a strong influence on RTN characteristics
Kenichi Abe, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.)
Physical analysis and reduction of random telegraph noise (RTN), which has become a major problem on advanced CMOS image... [more] IST2010-47
IST 2009-07-24
Tokyo Kikai-Shinko-Kaikan Bldg. Noise measurement of pixel transistors in CMOS image sensor
Toshiaki Yamagishi, Takahiro Kohara, Takafumi Fujisawa, Kenichi Abe, Shigetoshi Sugawa (Tohoku Univ.)
Threshold voltage variation and random noise generated in pixel source follower transistors of a CMOS image sensor have ... [more] IST2009-37
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