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Committee Date Time Place Paper Title / Authors Abstract Paper #
IST, IEICE-ICD 2011-07-22
Hiroshima Hiroshima Institute of Technology An All-Digital On-Chip PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator
Tetsuya Iizuka, Kunihiro Asada (Univ. of Tokyo)
This paper proposes an all-digital process variability monitor based on a shared structure of a buffer ring and a ring o... [more]
IST, IEICE-ICD 2010-07-22
Osaka Josho Gakuen Osaka Center Buffer-Ring-Based All-Digital On-Chip Monitor for PMOS and NMOS Process Variability
Tetsuya Iizuka, Toru Nakura, Kunihiro Asada (Univ. of Tokyo)
In this paper, we propose an all-digital process variability monitor which utilizes a simple buffer ring with a pulse co... [more]
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