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Committee Date Time Place Paper Title / Authors Abstract Paper #
IST, IEICE-ICD 2011-07-22
09:50		 Hiroshima Hiroshima Institute of Technology On-Chip Resonant Supply Noise Reduction Using Active Decoupling Capacitors
Jinmyoung Kim (Tokyo Univ.), Toru Nakura (VDEC), Hidehiro Takata, Koichiro Ishibashi (Renesas Electronics), Makoto Ikeda, Kunihiro Asada (VDEC) 		 [more]
IST, IEICE-ICD 2010-07-22
10:45		 Osaka Josho Gakuen Osaka Center Buffer-Ring-Based All-Digital On-Chip Monitor for PMOS and NMOS Process Variability
Tetsuya Iizuka, Toru Nakura, Kunihiro Asada (Univ. of Tokyo) 		In this paper, we propose an all-digital process variability monitor which utilizes a simple buffer ring with a pulse co... [more]
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