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Committee Date Time Place Paper Title / Authors Abstract Paper #
IST, IEICE-ICD 2014-07-03
13:55		 Shimane   [Invited Talk] Characterization of Individual Oxide Traps Contributing to Multi-Trap Random Telegraph Noise in Nano-Scaled MOSFETs
Toshiaki Tsuchiya (Shimane Univ.) 		We propose a novel method for characterizing the oxide traps that participate in random telegraph noise (RTN) by using c... [more] IST2014-32
pp.29-30
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