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| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2023-09-15
14:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
High Full Well Capacity and Low Noise Characteristics in 0.6 μm Pixels via Buried Sublocal Connections in a 2-Layer Transistor Pixel Stacked CMOS Imager Sensor
Keiji Nishida, Masataka Sugimoto, Tatsuya Okawa, Kanta Suzuki, Tomoharu Ogita, Katsunori Hiramatsu, Tomoyuki Hirano, Yoshiaki Kikuchi (SSS), Yuji Nishimura, Kohei Takeuchi, Daisuke Yoneyama, Toru Nagaki, Noriteru Yamada, Hiroyuki Kawashima (SCK), Yoshiaki Kitano (SSS) |
[more] |
IST2023-42
pp.29-32 |
| IST |
2022-09-22
13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Oxide Based Full Trench Isolation for Large Full Well Capacity and High Quantum Efficiency
Chihiro Tomita, Koichiro Zaitsu, Akira Matsumoto, Mizuki Nishida, Yusuke Tanaka, Hirofumi Yamashita, Yusuke Satake (SSS), Takashi Watanabe, Kunihiko Araki, Naoki Nei (SCK), Keiichi Nakazawa, Junpei Yamamoto, Mutsuo Uehara (SSS), Hiroyuki Kawashima, Yusaku Kobayashi (SCK), Tomoyuki Hirano, Keiji Tatani (SSS) |
[more] |
IST2022-34
pp.1-4 |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-08
09:00 |
Online |
On-line |
[Invited Talk]
A 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Oxide Based Full Trench Isolation for Large Full Well Capacity and High Quantum Efficiency
Koichiro Zaitsu, Akira Matsumoto, Mizuki Nishida, Yusuke Tanaka, Hirofumi Yamashita, Yosuke Satake (Sony Semiconductor Solutions), Takashi Watanabe, Kunihiko Araki, Naoki Nei (Sony Semiconductor Manufacturing), Keiichi Nakazawa, Junpei Yamamoto, Mutsuo Uehara (Sony Semiconductor Solutions), Hiroyuki Kawashima, Yusaku Kobayashi (Sony Semiconductor Manufacturing), Tomoyuki Hirano, Keiji Tatani (Sony Semiconductor Solutions) |
[more] |
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| IST |
2018-03-09
12:00 |
Tokyo |
NHK Housou-Gijyutu Lab. |
[Invited Talk]
Pixel/DRAM/logic 3-layer stacked CMOS image sensor technology
Hidenobu Tsugawa, Hiroshi Takahashi, Ryoichi Nakamura, Taku Umebayashi, Tomoharu Ogita, Hitoshi Okano, Kazuya Iwase, Hiroyuki Kawashima, Takatsugu Yamasaki, Daisuke Yoneyama, Jun Hashizume, Tsutomu Nakajima, Kenichi Murata, Yoshikazu Kanaishi, Kenji Ikeda, Keiji Tatani, Hajime Nakayama, Tsutomu Haruta, Tetsuo Nomoto (Sony) |
[more] |
IST2018-17
pp.25-29 |
| HI, VRPSY |
2015-11-14
11:10 |
Kagoshima |
Korimoto Campus, Kagoshima Univ. |
Stimulus duration dependency of surface quality judgment
-- relationship to image features --
Naozumi Yamada, Yuki Kawashima, Yasuki Yamauchi, Takehiro Nagai (Yamagata Univ.) |
In this study, we measured effects of stimulus durations for surface quality judgment. In addition, we analyzed these re... [more] |
HI2015-75
pp.55-58 |
| HI |
2013-12-07
11:15 |
Okinawa |
Okinawa Industry Support Center |
Characteristics of Luminance Uniformity Perception for Performance Evaluation of OLED
Yuki Kawashima, Yuki Nikaido, Yasuki Yamauchi, Masakatsu Hirasawa, Takehiro Nagai (Yamagata Univ.) |
One of the most important characteristics of organic electroluminescent (OLED) lighting is that it is a 2-dimensional su... [more] |
HI2013-74
pp.37-40 |
| HI |
2012-12-02
15:05 |
Okinawa |
Okinawa Industry Support Center |
[Invited Talk]
Determination characteristics for vection yielded by two optical flows
Yuki Kawashima, Kazuho Fukuda, Keiji Uchikawa (Tokyo Tech) |
We investigated the characteristic of speed of vection occurred from two optical flows that were overlapped in the same ... [more] |
HI2012-82
pp.17-23 |
| HI, CE, IEICE-HIP [detail] |
2010-10-15
11:15 |
Miyagi |
RIEC, Tohoku Univ. |
Influence of vection stimuli on the driver's speed sensation
Yuki Kawashima, Keiji Uchikawa, Hirohiko Kaneko, Kazuho Fukuda (Tokyo Tech), Kouji Yamamoto (C-NEXCO), Kenji Kiya (W-E-KYUSHU) |
In this study we investigated how much the driver's speed sensation increased when the driver perceived vection induced ... [more] |
CE2010-43 HI2010-95
pp.73-77 |
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