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Committee Date Time Place Paper Title / Authors Abstract Paper #
IDY, IEICE-EID, IEE-EDD 2013-01-25
10:02
Shizuoka Shizuoka Univ. Development of Simulation Model for Oxide Semiconductor Thin-Film Transistors
Hiroshi Tsuji, Mitsuru Nakata, Hiroto Sato, Yoshiki Nakajima, Yoshihide Fujisaki, Tatsuya Takei, Toshihiro Yamamoto, Hideo Fujikake (NHK)
A new simulation model for current-voltage characteristics of oxide semiconductor thin-film transistors (a-IGZO TFTs) is... [more] IDY2013-7
pp.69-72
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