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IST
2023-06-21
13:10
Tokyo
Tokyo University of Science Morito Memorial Hall
[Poster Presentation] Analysis of Light Intensity and Charge Holding Time Dependence of Full Well Capacity in CMOS Image Sensor with A Buried Overflow Transfer Gate
Ken Miyauchi
(
Brillnics/Tohoku Univ.
),
Toshiyuki Isozaki
,
Rimon Ikeno
,
Junichi Nakamura
(
Brillnics
)
In this paper, an analytical model of CMOS image sensor full well capacity with a buried overflow transfer gate is propo...
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IST2023-19
pp.1-4
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