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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-09
14:00 |
Online |
On-line |
High-precision small capacitance difference measurement using proximity capacitance sensor
Yoshiaki Watanabe, Yuki Sugama, Yoshinobu Shiba, Rihito Kuroda, Yasuyuki Shirai, Shigetoshi Sugawa (Tohoku Univ.) |
A proximity capacitance sensor for measuring small capacitance differences was designed and fabricated using 0.18 μm CMO... [more] |
IST2022-31
pp.71-76 |
| IST |
2021-10-21
10:50 |
Online |
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High-precision CMOS Proximity Capacitance Image Sensors with Large-format 12 µm and High-resolution 2.8 µm Pixels
Yuki Sugama, Yoshiaki Watanabe, Rihito Kuroda, Masahiro Yamamoto, Tetsuya Goto (Tohoku Univ.), Toshiro Yasuda, Shinichi Murakami, Hiroshi Hamori (OHT), Naoya Kuriyama (LAPIS Semiconductor), Shigetoshi Sugawa (Tohoku Univ.) |
This paper presents newly developed two high-precision CMOS proximity capacitance image sensors: Chip A with 12 µm pitch... [more] |
IST2021-51
pp.13-16 |
| IST |
2016-03-11
15:55 |
Tokyo |
NHK Research Lab (Setagaya) |
Device Simulations for Ultrahigh-Speed and High-Voltage Image Sensors
Hideki Mutoh (Link Research) |
Physical models and algorithms for use in device simulations of ultrahigh-speed and high-voltage image sensors are repor... [more] |
IST2016-18
pp.45-48 |
| IEICE-ITS, IEICE-IE, AIT, HI, ME [detail] |
2013-02-18
09:40 |
Hokkaido |
Hokkaido Univ. |
High Precision and High Speed Method to Estimate Unpleasantness Degree of Flickering Images
Makoto Tadenuma (NHK) |
The author developed a method that estimates the unpleasantness degree evoked by flickering images, and reported the met... [more] |
HI2013-29 ME2013-57 AIT2013-29
pp.183-187 |
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