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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2016-08-03
14:40 |
Osaka |
Central Electric Club |
PN-Body Tied Super Steep SS FET with Body Bias below 1V and Drain Bias 0.1V
Takahiro Yoshida, Jiro Ida, Takashi Horii (KIT), Masao Okihara (Lapis), Yasuo Arai (KEK) |
We have found out that the super steep Subthreshold Slope (SS) of the PN-body tied SOI FET appeared with the body voltag... [more] |
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| IEICE-ICD, IEICE-SDM, IST [detail] |
2016-08-03
15:05 |
Osaka |
Central Electric Club |
Increased Drain-Induced Variability and Within-Device Variability in Extremely Narrow Silicon Nanowire MOSFETs with Width down to 2nm
Tomoko Mizutani, Kiyoshi Takeuchi, Ryota Suzuki, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto (Univ. of Tokyo) |
The effects of drain voltage in threshold voltage variability in extremely narrow silicon nanowire (NW) channel FETs are... [more] |
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| IST, IEICE-ICD |
2014-07-03
13:55 |
Shimane |
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[Invited Talk]
Characterization of Individual Oxide Traps Contributing to Multi-Trap Random Telegraph Noise in Nano-Scaled MOSFETs
Toshiaki Tsuchiya (Shimane Univ.) |
We propose a novel method for characterizing the oxide traps that participate in random telegraph noise (RTN) by using c... [more] |
IST2014-32
pp.29-30 |
| IST |
2010-09-27
16:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Techniques for high accurate and fast measurement of RTN and fabrication process conditions having a strong influence on RTN characteristics
Kenichi Abe, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) |
Physical analysis and reduction of random telegraph noise (RTN), which has become a major problem on advanced CMOS image... [more] |
IST2010-47
pp.29-32 |
| IST |
2008-12-17
11:00 |
Tokyo |
Univ. of Tokyo |
Column-Parallel Amplifier Noise Reduction Techniques for CMOS Image Sensors
Takuma Shirei, Suh Sung-ho, Shinya Ito, Shoji Kawahito (Shizuoka Univ.) |
Random telegraph signal (RTS) and 1/f noises in source followers are becoming a most important issue for low-light level... [more] |
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