ITE Technical Group Submission System
Conference Schedule |
Online Proceedings
[Sign in]
|
|
|
|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
|
| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
|
| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST, IEICE-ICD |
2014-07-03
13:55 |
Shimane |
|
[Invited Talk]
Characterization of Individual Oxide Traps Contributing to Multi-Trap Random Telegraph Noise in Nano-Scaled MOSFETs
Toshiaki Tsuchiya (Shimane Univ.) |
We propose a novel method for characterizing the oxide traps that participate in random telegraph noise (RTN) by using c... [more] |
IST2014-32
pp.29-30 |
| IST |
2014-03-14
16:40 |
Tokyo |
NHK |
Low Noise Multi-aperture camera by Selective Averaging
Bo Zhang, Keiichiro Kagawa, Taishi Takasawa, Min-Woong Seo, Keita Yasutomi, Shoji Kawahito (Shizuoka Univ.) |
A low noise multi-aperture camera which has a synthetic F-number much smaller than 1.0 by increasing optical gain using ... [more] |
IST2014-16
pp.31-34 |
| IST |
2010-09-27
16:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Techniques for high accurate and fast measurement of RTN and fabrication process conditions having a strong influence on RTN characteristics
Kenichi Abe, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) |
Physical analysis and reduction of random telegraph noise (RTN), which has become a major problem on advanced CMOS image... [more] |
IST2010-47
pp.29-32 |
|
|
|
|
|
[Return to Top Page]
[Return to ITE Web Page]
|