ITE Technical Group Submission System
Conference Schedule |
Online Proceedings
[Sign in]
|
|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
3DMT |
2024-03-14 16:10 |
Tokyo |
(Primary: On-site, Secondary: Online) |
Creation of 3D model from ToF camera using light reflection intensity Shuto Ogura (Tokushima Univ.), Toshihide Kobayasi, Atsushi Suzuki, Ryousuke Nakagoshi (JVCKENWOOD Corp.), Haruki Mizusina, Kenji Yamamoto (Tokushima Univ.) |
We propose an algorithm that uses the reflection intensity of light to remove flying pixels from a 3D point cloud model ... [more] |
3DMT2024-13 pp.49-52 |
IST |
2022-06-29 14:30 |
Online |
|
Phase-detection autofocus system for 8K three-chip imaging camera Kodai Kikuchi, Kodai Tomioka, Toshio Yasue, Tomohiro Nakamura, Kazuya Kitamura, Takayuki Yamashita (NHK) |
We developed a phase detection autofocus (PDAF) for three-chip imaging broadcasting cameras that detects disparity betwe... [more] |
IST2022-28 pp.13-16 |
IST |
2018-06-27 14:10 |
Tokyo |
Tokyo Univ. Sci.-Morito-Kinenkan |
[Poster Presentation]
[Poster Presentation] A backside illumination fully depleted SOI pixel detector for time-of-flight range imaging Ho Hai Nam, Keita Yasutomi, Sanggwon Lee, Shoji Kawahito (Shizuoka Univ.) |
A back-illuminated fully-depleted silicon-on-insulator (SOI) time-of-flight (TOF) image sensor have been realized using ... [more] |
IST2018-38 pp.29-32 |
IST |
2014-12-01 16:30 |
Tokyo |
Tamachi Campus, Tokyo Institute of Technology |
[Poster Presentation]
High-speed three dimensional measurement by exposure time coding and time of flight with a multi-aperture imaging system Koshiro Moriguchi, Daisuke Miyazaki (Osaka City Univ.), Keiichiro Kagawa, Futa Mochiduki (Shizuoka Univ.) |
A three-dimensional measurement scheme based on time-of-flight method using multi-aperture image capturing system, which... [more] |
IST2014-75 pp.45-46 |
|
|
|
[Return to Top Page]
[Return to ITE Web Page]
|