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Paper #
IST
2023-06-21
13:10
Tokyo
Tokyo University of Science Morito Memorial Hall
[Poster Presentation] Analysis of Light Intensity and Charge Holding Time Dependence of Full Well Capacity in CMOS Image Sensor with A Buried Overflow Transfer Gate
Ken Miyauchi
(
Brillnics/Tohoku Univ.
),
Toshiyuki Isozaki
,
Rimon Ikeno
,
Junichi Nakamura
(
Brillnics
)
In this paper, an analytical model of CMOS image sensor full well capacity with a buried overflow transfer gate is propo...
[more]
IST2023-19
pp.1-4
HI
,
IEICE-MVE
,
VRSJ
,
HI-SIG-VR
2015-07-02
14:30
Tokyo
Sanjo Conference Hall
A Trial Evaluation of HMD Quality by Sense of Equilibrium
Soma Kawamura
,
Ryugo Kijima
(
Gifu Univ.
)
Evaluation of visual presentation quality of HMD has been done on the based on the virtual sickness and task performance...
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