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Technical Group on Information Sensing Technologies (IST)  (2010)

Chair: Junichi Akita (Kanazawa Univ.) Vice Chair: Masayuki Ikebe (Hokkaido Univ.), Yutaka Hirose (Panasonic)
Secretary: Takashi Komuro (Saitama Univ.), Kazuhiro Shimonomura (Ritsmeikan Univ.), Keiichiro Kagawa (Shizuoka Univ.), Takashi Tokuda (Tokyo Inst. of Tech.), Rihito Kuroda (Tohoku Univ.), Kazuya Kitamura (NHK), Yuichiro Yamashita (TSMC), Shunsuke Okura (Ritsumeikan Univ.), Yoshiaki Takemoto (MEMS CORE)

Search Results: Keywords 'from:2010-09-27 to:2010-09-27'

[Go to Official IST Homepage (Japanese)] 
Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
IST 2010-09-27
13:00
Tokyo Kikai-Shinko-Kaikan Bldg. [Memorial Lecture] Special Program, "Fortieth Anniversary Speech of the Born of CCD - at the Dawn"
Shigeyuki Ochi
Milestone events and episodes of CCD Development and Commercialization are mainly described during about twenty years f... [more] IST2010-42
pp.1-8
IST 2010-09-27
13:45
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Multi-Core Utilization Technology -- Domain Separation and Context-Aware Resource Allocation --
Masato Edahiro (NEC)
 [more] IST2010-43
pp.9-12
IST 2010-09-27
14:45
Tokyo Kikai-Shinko-Kaikan Bldg. [Memorial Lecture] [Commemorative Speech] Japan in the World of Image Sensors -- What Japan has been playing the role of and What could be learnt from the History --
Takao Kuroda (Panasonic)
After an overview of the early image sensor technologies, the technological transition in the dawn of Japan is reviewed.... [more] IST2010-44
pp.13-20
IST 2010-09-27
15:30
Tokyo Kikai-Shinko-Kaikan Bldg. Analysis on Characteristics of Light Transmission for multiple-metal layer nano-meter CMOS
Makoto Ikeda (University of Tokyo)
 [more] IST2010-45
pp.21-24
IST 2010-09-27
16:00
Tokyo Kikai-Shinko-Kaikan Bldg. Performance Improvements of Polarization-Analyzing Image Sensor using 65nm CMOS process
Sanshiro Shishido, Toshihiko Noda, Kiyotaka Sasagawa, Takashi Tokuda, Jun Ohta (NAIST)
 [more] IST2010-46
pp.25-28
IST 2010-09-27
16:30
Tokyo Kikai-Shinko-Kaikan Bldg. Techniques for high accurate and fast measurement of RTN and fabrication process conditions having a strong influence on RTN characteristics
Kenichi Abe, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.)
Physical analysis and reduction of random telegraph noise (RTN), which has become a major problem on advanced CMOS image... [more] IST2010-47
pp.29-32
 Results 1 - 6 of 6  /   
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