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Paper Abstract and Keywords
Presentation 2011-03-11 11:40
A Behavior Model of Panicked Crowd Considering Field of Vision
Kosuke Kabatani, Tomoaki Moriya, Tokiichiro Takahashi (TDU)
Abstract (in Japanese) (See Japanese page) 
(in English) Crowd simulation is now used in 3D computer graphics for film or video game. A task to create a character motion in a crowd one by one is required a lot of time and effort. To solve this problem, characters in a crowd are given AI for guiding characters. In this paper, we propose a new AI algorithm for panicked crowd. Our AI algorithm considers two types field of view to generate panicked crowd. And we show experimental results which a crowd simulates using our AI algorithm in various types of virtual building interior.
Keyword (in Japanese) (See Japanese page) 
(in English) Crowd / Panic / Field of Vision / / / / /  
Reference Info. ITE Tech. Rep., vol. 35, pp. 45-48, March 2011.
Paper #  
Date of Issue 2011-03-04 (AIT) 
ISSN Print edition: ISSN 1342-6893  Online edition: ISSN 2424-1970
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Conference Information
Committee AIT IIEEJ  
Conference Date 2011-03-11 - 2011-03-11 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokyo Denki Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To IIEEJ 
Conference Code 2011-03-AIT-IIEEJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Behavior Model of Panicked Crowd Considering Field of Vision 
Sub Title (in English)  
Keyword(1) Crowd  
Keyword(2) Panic  
Keyword(3) Field of Vision  
1st Author's Name Kosuke Kabatani  
1st Author's Affiliation Tokyo Denki University (TDU)
2nd Author's Name Tomoaki Moriya  
2nd Author's Affiliation Tokyo Denki University (TDU)
3rd Author's Name Tokiichiro Takahashi  
3rd Author's Affiliation Tokyo Denki University (TDU)
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Date Time 2011-03-11 11:40:00 
Presentation Time 110 
Registration for IIEEJ 
Paper # AIT2011-24 
Volume (vol) 35 
Number (no) no.14 
Page pp.45-48 
Date of Issue 2011-03-04 (AIT) 

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