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Paper Abstract and Keywords
Presentation 2011-07-22 10:25
Analysis Methods of Substrate Sensitivity in an Analog Circiut
Satoshi Takaya, Yoji Bando (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.)
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Conference Information
Committee IST IEICE-ICD  
Conference Date 2011-07-21 - 2011-07-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Hiroshima Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed analog and digital, RF, and sensor interface circuitry 
Paper Information
Registration To IEICE-ICD 
Conference Code 2011-07-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Analysis Methods of Substrate Sensitivity in an Analog Circiut 
Sub Title (in English)  
1st Author's Name Satoshi Takaya  
1st Author's Affiliation Kobe University (Kobe Univ.)
2nd Author's Name Yoji Bando  
2nd Author's Affiliation Kobe University (Kobe Univ.)
3rd Author's Name Toru Ohkawa  
3rd Author's Affiliation MIRAI-Selete (MIRAI-Selete)
4th Author's Name Masaaki Souda  
4th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
5th Author's Name Toshiharu Takaramoto  
5th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
6th Author's Name Toshio Yamada  
6th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
7th Author's Name Shigetaka Kumashiro  
7th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
8th Author's Name Tohru Mogami  
8th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
9th Author's Name Makoto Nagata  
9th Author's Affiliation Kobe University (Kobe Univ.)
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Speaker Author-1 
Date Time 2011-07-22 10:25:00 
Presentation Time 25 minutes 
Registration for IEICE-ICD 
Paper #  
Volume (vol) vol.35 
Number (no)  
Date of Issue  

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