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Presentation 2012-01-28 10:18
High Precision Measurement of Twist Elastic Constant K22 of LC Materials Based on the Ellipsometry Analysis
Takahiro Ishinabe, Yuzuka Morita, Yuji Ohno (Tohoku Univ.), Tetsuya Miyashita (Tohoku Inst. of Tech), Tatsuo Uchida (Sendai Nat. College of Tech)
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Conference Information
Committee IEICE-EID IDY IEE-EDD  
Conference Date 2012-01-27 - 2012-01-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Akita University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Display technology, etc 
Paper Information
Registration To IEICE-EID 
Conference Code 2012-01-EID-IDY-EDD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) High Precision Measurement of Twist Elastic Constant K22 of LC Materials Based on the Ellipsometry Analysis 
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1st Author's Name Takahiro Ishinabe  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Yuzuka Morita  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Yuji Ohno  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Tetsuya Miyashita  
4th Author's Affiliation Tohoku Institute of Technology (Tohoku Inst. of Tech)
5th Author's Name Tatsuo Uchida  
5th Author's Affiliation Sendai National College of Technology (Sendai Nat. College of Tech)
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Date Time 2012-01-28 10:18:00 
Presentation Time 8 minutes 
Registration for IEICE-EID 
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Volume (vol) vol.36 
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