Paper Abstract and Keywords |
Presentation |
2012-02-21 12:00
Environmental invariance Evaluation using SIFT Feature of Facial Image Tsuyoshi Makioka, Takami Satonaka (Kumamoto Prefectural College of Tec.), Tomomi Yamaguchi, Ryosuke Oda, Gou Koutaki, Keiichi Uchimura (Kumamoto Univ.) |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We employ the SIFT (Scale Invariant Feature Transform) features to evaluate the effect of environmental variations on face recognition system. In previous papers, the SIFT method has been mainly used for the objects with distinct features such as texture and character. The performance of face recognition has degraded under the variation of illuminations. We reveal significant properties of the recognition using SIFT for facial images with various facial expressions and the variation of illumination and pose. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
face recognition / facial image / security / SIFT features / / / / |
Reference Info. |
ITE Tech. Rep., vol. 36, no. 9, ME2012-66, pp. 293-298, Feb. 2012. |
Paper # |
ME2012-66 |
Date of Issue |
2012-02-13 (HI, ME, AIT) |
ISSN |
Print edition: ISSN 1342-6893 |
Download PDF |
|