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Paper Abstract and Keywords
Presentation 2013-09-30 13:00
New model of Dark fixed pattern noise generation in CMOS imager pixel with negative transfer-gate bias operation
Hiroki Sasaki, Yusuke Higashi, Hirofumi Yamashita, Takeshi Yoshida, Nobuyuki Momo, Tatsuya Ohguro, Hisayo Momose, Yoshiaki Toyoshima (Toshiba)
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(in English) (Not available yet)
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Reference Info. ITE Tech. Rep., vol. 37, no. 40, IST2013-42, pp. 1-4, Sept. 2013.
Paper # IST2013-42 
Date of Issue 2013-09-23 (IST) 
ISSN Print edition: ISSN 1342-6893  Online edition: ISSN 2424-1970

Conference Information
Committee IST  
Conference Date 2013-09-30 - 2013-09-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To IST 
Conference Code 2013-09-IST 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) New model of Dark fixed pattern noise generation in CMOS imager pixel with negative transfer-gate bias operation 
Sub Title (in English)  
1st Author's Name Hiroki Sasaki  
1st Author's Affiliation Toshiba (Toshiba)
2nd Author's Name Yusuke Higashi  
2nd Author's Affiliation Toshiba (Toshiba)
3rd Author's Name Hirofumi Yamashita  
3rd Author's Affiliation Toshiba (Toshiba)
4th Author's Name Takeshi Yoshida  
4th Author's Affiliation Toshiba (Toshiba)
5th Author's Name Nobuyuki Momo  
5th Author's Affiliation Toshiba (Toshiba)
6th Author's Name Tatsuya Ohguro  
6th Author's Affiliation Toshiba (Toshiba)
7th Author's Name Hisayo Momose  
7th Author's Affiliation Toshiba (Toshiba)
8th Author's Name Yoshiaki Toyoshima  
8th Author's Affiliation Toshiba (Toshiba)
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Date Time 2013-09-30 13:00:00 
Presentation Time 20 
Registration for IST 
Paper # ITE-IST2013-42 
Volume (vol) ITE-37 
Number (no) no.40 
Page pp.1-4 
#Pages ITE-4 
Date of Issue ITE-IST-2013-09-23 

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