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Paper Abstract and Keywords
Presentation 2014-02-18 09:50
Road lane marking detection using phase information
Yuichi Kumagaya, Keisuke Yoneda, Chenxi Yang, Seichi Mita (TTI)
Abstract (in Japanese) (See Japanese page) 
(in English) Robust detection of road lane markings (white line) is an important theme for Intelligent Transport Systems (ITS) especially for lane keeping assistance systems. Although there are a lot of researches on white line detection in extreme cases such as tunnel and night scenes, none of them provide sufficient performance.We propose a robust white line detector using Phase congruency without luminosity value. Phase congruency is an efficient edge detector in some extreme cases. However, this provides too noisy result to detect the white line. Proposed method removes noises using stochastic and image processing.
Keyword (in Japanese) (See Japanese page) 
(in English) Road lane marking detection / Phase congruency / stochastic process / image processing / / / /  
Reference Info. ITE Tech. Rep.
Paper #  
Date of Issue  
ISSN Print edition: ISSN 1342-6893  Online edition: ISSN 2424-1970
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Conference Information
Conference Date 2014-02-17 - 2014-02-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) ITS Image Processing, etc. 
Paper Information
Registration To IEICE-ITS 
Conference Code 2014-02-ITS-IE-AIT-HI-ME 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Road lane marking detection using phase information 
Sub Title (in English)  
Keyword(1) Road lane marking detection  
Keyword(2) Phase congruency  
Keyword(3) stochastic process  
Keyword(4) image processing  
1st Author's Name Yuichi Kumagaya  
1st Author's Affiliation Toyota Technical Institute (TTI)
2nd Author's Name Keisuke Yoneda  
2nd Author's Affiliation Toyota Technical Institute (TTI)
3rd Author's Name Chenxi Yang  
3rd Author's Affiliation Toyota Technical Institute (TTI)
4th Author's Name Seichi Mita  
4th Author's Affiliation Toyota Technical Institute (TTI)
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Date Time 2014-02-18 09:50:00 
Presentation Time 15 
Registration for IEICE-ITS 
Paper #  
Volume (vol) ITE-38 
Number (no)  
#Pages ITE- 
Date of Issue  

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